Showing results: 181 - 195 of 544 items found.
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Empyrean Range -
Malvern Panalytical Ltd
With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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NM Series -
Toray Engineering Co., Ltd.
Detecting failures and uneven points on color resist film coated by Toray’s Coater. Toray’s customized algorithm achieved fast throughput and high resolution.
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Hiden Analytical Ltd.
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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413 Series -
Frontier Semiconductor, Inc,
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Advanced Energy
Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Nova Measuring Instruments Inc.
Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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Kasuga Denki, Inc.
In the electronic equipment assembly process, there are many items that are charged on the order of kV, such as resin molded products and films. This digital electrostatic potential measuring instrument is suitable for processes with relatively high electrostatic control voltage.The measurement range switching function makes it possible to measure from low potential measurement of electronic devices to high potential measurement of resin molded products, film / printed circuit board manufacturing, etc.
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Onto Innovation
Optical critical dimension (OCD) metrology and film metrology require accuracy and repeatability. Onto Innovation's techniques are well-established and trusted by semiconductor manufacturers around the globe.
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SKZ148 -
SKZ Industrial Co., Ltd
Dart impact testing machine used for plastic films and sheets of impact test to evaluate the impact resistance, it adopts background light source for test results.
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ADT-02 -
Jinan Leading Instruments Co., Ltd.
ADT-02 Lasting Adhesive Tester isapplicable in the lasting adhesive testing of pressure sensitive adhesivetapes, adhesive bandage(plaster), adhesive labels and protective films, etc.
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THC Series -
Shimadzu Corp.
Optimal chamber for testing materials with mechanical properties sensitive to temperature and humidity effects, such as fibers, paper, or films. Temperature regulation: Automatic control by heater and refrigerator.
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HS-MPRT-5 -
HenergySolar
t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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CZY-G -
Jinan Saicheng Instrument
CZY-G Initial Adhesion Tester is suitable for pressure-sensitive tapes, medical patches, self-adhesive labels, protective films and other related products for initial tack testing.
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4695 -
Elcometer Limited
In a typical scrub test, the coating is applied to the Leneta Scrub Test Panel at a specified film thickness, allowed to dry and then subjected to scrubbing with a straight-line scrub tester.
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FilmTek 2000 PAR-SE -
Scientific Computing International
Our most advanced benchtop metrology solution, engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.