Showing results: 361 - 375 of 544 items found.
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Anton Paar GmbH
The DMA systems from Anton Paar perform dynamic mechanical analysis in torsion, tension, bending and compression at unprecedented precision. Whatever your DMA requirements are, the DMA systems from Anton Paar are efficiently and comfortably adapted to meet your needs. Use the systems for the dynamic mechanical analysis of solutions, melts, solid bars, films, foils, or reactive resins.
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Radiant Technologies, Inc.
Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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AMETEK Sensors, Test & Calibration
We provide the world’s only ball-type deadweight testers, where the ball and weights float on a thin film of air, which is virtually frictionless. This design eliminates the necessity to rotate the weights during testing, and allows the user to concentrate on the instrument itself. Our testers are engineered to offer user-friendly, safe operation, in the field, or in a lab. Both pneumatic and hydraulic testers are available.
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HORIBA, Ltd.
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Veeco Instruments Inc
Deposit dense, uniform, and repeatable thin, diamond-like carbon (DLC) films for longer-lasting TFMH slider overcoats and landing pads with Veeco's NEXUS DLC-X System. The Nexus DLC-X features the industry's first production-worthy Pulsed Filtered Cathode Arc Source to enable sub-20A overcoat thickness, and supports improved step coverage for better process yield compared to previous generations.
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STAN Series -
Ocean Optics, Inc.
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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MKS Instruments
Semiconductor and Electronic Thin Film applications use plasma sources to generate low-energy ions and radicals to react with material surfaces and chamber walls to remove contaminants and act as a precursor to aid in material deposition. MKS provides multiple options for radical generation including Toroidal and Microwave based Remote Plasma Sources supporting Fluorine, NF3, oxygen, nitrogen and hydrogen process chemistries.
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HUBDISK-1 -
U. S. Digital
US Digital offers a wide variety of standard hub / disk assemblies (optical encoder disks attached to an aluminum hub) to aid with mounting on a shaft. Encoder disks may also be ordered as a stand alone item (see the Disks page). These rotary encoder disks are made from mylar polyester film. This material allows for a wide temperature range and is virtually unbreakable.
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HUBDISK-2 -
U. S. Digital
US Digital offers a wide variety of standard hub / disk assemblies (optical encoder disks attached to an aluminum hub) to aid with mounting on a shaft. Encoder disks may also be ordered as a stand alone item (see the Disks page). These rotary encoder disks are made from mylar polyester film. This material allows for a wide temperature range and is virtually unbreakable.
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Applied Image, Inc.
The Sinusoidal Array SINE M-7 has an image size of 22mm x 30mm which makes it small enough to fit into a standard 35mm projection frame. The gray scale is contained in the outer rows. It is made on 35mm perforated film.The TM-G variations are produced on a wider film (without perforations) and cemented between glass. They are available at each modulation (-35, -60, -80).
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ElectroStatics, Inc.
Static bars, also known as, static eliminators or anti static bars, are a very cost effective way to remove static electricity on a web of material in a plastics, paper, glass, textile, and or film converting applications. All of these static bars are bi-polar ionization generators (produce both positive and negative ionization) to remove static electricity. Remember - A clean static bar is more effective.
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HY-OPTIMA™ 2700 Series -
H2scan Corp.
The HY-OPTIMA™ 2700 Series uses a solid-state, non consumable sensor that is configured to operate in process gas streams. The H2scan thin film technology provides a direct hydrogen measurement that is not cross sensitive to other gases. The HY-OPTIMA™ 2700 Series is ideal for applications where real-time, hydrogen specific measurements can enhance process plant efficiencies, diagnostics and maintenance management.
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Naprotek, LLC.
SemiGen's Inductor Coils are manufactured using our thin film process on quartz substrates. The precision photolithography and non-chemical etching process provides clean edges to assure uniformity from coil to coil. By using quartz and applying a polyimide coating we produce a device that eliminates the need for conformal coating or staking. Inductors can be epoxied down with nonconductive epoxy and the wire bonded for connection.
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NOVOTEST ED-3D -
NovoTest
NOVOTEST ED-3D Pinhole Detector was designed for rapid non-destructive testing of the continuity of coating (e.g. porosity of film) with thickness up to 500mkm according to ASTM G62-A.Pinhole Detector is designed for testing the porosity of partially painted places and other discontinuities of protective dielectric coatings on metal products by putting low voltage through a sponge which is soaked in a liquid electrolyte with high penetrating properties.
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IMPULSE V -
Onto Innovation
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.