Showing results: 256 - 270 of 547 items found.
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Titan -
The Eclipse Foundation
Titan is a TTCN-3 compilation and execution environment with an Eclipse-based IDE. The user of the tool can develop test cases, test execution logic and build the executable test suite for several platforms. TTCN-3 is a modular language specifically designed for testing (the acronym itself stands for Test and Test Conformance Notation), standardized by ETSI (see www.ttcn-3.org) and endorsed by ITU.
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Time Machine -
SolutionSoft Systems Inc.
Time Machine provides software virtual clocks that enable you to time travel your applications into the future or the past, facilitating time shift testing on your date and time sensitive application logic, such as month end, quarter end, year end processing, billing cycle, work flow, regulatory go live, and policy life cycle.
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F9 Systems, Inc.
The CalBlade backplane calibration fixture isdesigned to permit accurate and convenient impedance and transmission measurements of a HM-Zd backplane. The CalBlade is used to calibratethe logic card connector interface to the backplane rather than to the usual far-end of the coaxial measurement cables. Very accurate impedance, skew and propagation delay measurements are possible since parasitic fixturing effects are removed.
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1S663-001 -
Sigma Tek, Inc.
The 1S663-001 Data Monitoring System was specifically developed for the Cessna Citation X and serves as the primary diagnostic tool for the aircraft?? electronic Logic Modules. The system is FAA certified for airborne operation. Aft compartment and cabin modules can be tested two at a time while remaining in place. The system is also capable of monitoring the fuel quantity system during flight.
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JSCAN -
Navatek Engineering Corp.
JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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NI
Industrial Controllers are high-performance, fanless controllers that provide connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. Controllers also have onboard isolated, transistor‐transistor logic (TTL), and differential digital I/O. You can use LabVIEW system design software to create, debug, and deploy logic to both the onboard FPGA and the processor. LabVIEW contains over 950 signal processing, analysis, control, and mathematics functions to accelerate development.
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Avtec Systems, Inc.
RT Logic recorder systems are trusted to record and faithfully replay the most critical signals and data streams—analog baseband, IF, digital serial, IP packets, and timing signals—from DC to multi-Gbps.
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Link Instruments
A Pattern Generator outputs digital data and is used to stimulate circuits. The data can be from user files, previously captured data or from the data creation wizard (editor) in the software. All of our Pattern Generators (digital word generators) are also Logic Analyzers and are controlled with easy-to-use Windows software. Some or all of the outputs are bi-directional and can be used to capture data.
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ACTAS CF80 -
KoCoS Messtechnik AG
Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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JT 2111/MPV DIOS IDC -
JTAG Technologies Inc.
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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TEST-330 -
Beijing GFUVE Electronics Co.,Ltd.
Test-330 three phase protective relay test equipment is a three phase current output and five phase voltage output relay tester with embedded host machine equipped with Complex Programmable Logic Device.
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40-410-001 -
Pickering Interfaces Ltd.
The 40-410 range of Digital I/O Modules are suitable for operating external devices, such as heavy duty relays (power, RF and high voltage types), solenoids, lamps, or for interfacing with external logic such as a programmable instrument with a BCD interface.
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NS-7001 -
Innovative Technical Systems
The NS-7001 is high-power noise source specifically designed to operate in the 2.11-2.17 GHz UMTS band. It features flat output power that is regulated over a wide temperature range with high rejection outside the operating band of interest. Logic control is provided to enable/disable the noise source and an internal BIT function continuously monitors the output power. Other frequency bands and power levels are available.
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Laurel Electronics, Inc
Accepts low-level differential or single-ended 5 V logic level quadrature signals from shaft encoders to display scaled position or scaled rate. One, two or four transitions may be counted at a maximum combined rate of 250 kHz and be mathematically scaled to display in engineering units from -999,999 to +999,999. An analog output scaled to the display and relay outputs are optional.
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TestKompress -
Mentor Graphics Corp.
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).