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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,.·Up to 1500Vdc/1000Vac Test Voltage ,.·256 Max. Test Points , (Max of all series).·500 Max Files Memory,support USB or PC unlimited expansion,.·Arc detection level 0-9 ,auto prompt.·Adopted high resolution colour 640*480 TFT LCD ,.·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire..·Auto Scan and Auto Pin Search ,.·The system provides advanced instant open-circuit, short-circuit, continuity test,.·Intermittent Conductance Test,.·Intermittent Open/Short Test ,.·Full Programming Sequence Test ,.·Versatile I/O Ports for application ,.·Statistics and Print Function,.·Provide REMOTE interface, communicate with PLD auto test fixture,.·Provide personalized customization according to different requirements,
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Logic Analyzer
FS2352B
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Portable Spectrum Analyzer
LPT-3000 Portable Spectrum AnalyzerThe LP Technologies LPT-3000 Spectrum Analyzer is a fully synthesized RF Spectrum Analyzer featuring simple user controls which allow the novice or the seasoned expert to use the LPT-3000 right out of box. The LPT3000 provides you with a powerful RF test and measurement tool for CDMA and WCDMA RF systems, broadcast RF systems, EMI/EMC. The features include 6.4 color display, centronics printer, internal memory, USB host, built in CDMA measurement (ACP, Channel Power and Occupied bandwidth). The LPT 3000 Spectrum Analyzer gives educational institutions, mobile and communication system manufactures and RF product service centers a quality RF test instrument at an unbelievably affordable price.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Audio Test Software
1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Evaluation Kit
ROM-3310 Development Kit
*Evaluation kit for ROM-3310*Lower power TI sitara AM3352 1GHz processor*On board DDR3 512MB memory / 4GB Flash*HW WDT for system protection*Supports 1 GbE, 1 USB 2.0, 1 USB 2.0 OTG, 2 CANbus, 10 GPIO, 4 UART,1 I2C, 1 I2S, 1 SPI, 1 SDIO*Cable pack & Panel included*Evaluative image & test utilities built-in
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Probes And Cables
The iProbe is an intelligent temperature sensor that can be calibrated independently of SBIR’s blackbody systems or 104i precision thermometers. These ultra-stable, highly responsive iProbes are used to provide long term accuracy and repeatability of under 0.010°C. Each iProbe incorporates onboard flash memory that allows all calibration constants and calibration date information to be stored independently of the blackbody or thermometer system. This allows iProbes to be exchanged for use on a blackbody or thermometer without any loss in stability or accuracy. To re-calibrate a system you need only exchange the current iProbe with a recently calibrated one. No special equipment is required and there is no down time in the test area.
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Touch Screen Controller
EZT-570i
The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
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Stack Analysis
VerOStack
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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AFDX®/ARINC664P7 Modules
AIM’s AFDX®/ARINC664P7 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. Versions are available to support the Boeing specific ARINC664P7 extensions.
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Capacitor Leakage Current Meter
DU2316/2317
Delta United Instrument Co., Ltd.
Leackage Current range display: 0.0001uA ~ 20.00mAAutomatic or Manual trigger with CHARGE/TEST/DISCHARGE100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceHi / Lo current limit setting & PASS/FAIL judgment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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C Meter
DU-6210
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Programmable LCR Meter
DU-6211
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 75 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Programmable LCRZ Meter
DU-6212/6215/6216
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Circuit Breaker Analyzers & Timers
CAT Standard Series
Circuit breakers are being tested during manufacturing, commissioning or maintenance stages. The most basic test requires timing measurement using circuit breaker timer. Their primary role is timing and motion measurement of medium and high voltage circuit breakers. Devices from CAT Standard series have suitable application in:electric power generation,distribution system,part of the electric power transmission system,contractors testing,and industrial environments.CAT Standard series meets the requirements of an easy to use circuit breaker timer and analyzer with an attractive price. Furthermore, they are portable and lightweight (weighs only up to 7 kg). Finally, the plastic case is unbreakable and has IP67 protective rating when the lid is closed.CAT Standard series includes five models:Three circuit breaker timers – CAT03, CAT31, and CAT61Two circuit breaker analyzers – CAT34 and CAT64CAT03 is a basic model intended only for timing measurement of main contact operations on the circuit breaker with one break per phase. Unlike CAT03, CAT31 has the possibility of circuit breaker operation initiation, coil current measurement, and auxiliary contact timing measurement. CAT61 differs in comparison to CAT31 by its ability to measure up to two breaks per phase.CAT34 and CAT64 are more advanced compared to CAT31 and CAT61, respectively, since they have additional analog channels. Also, they have the possibility of a travel curve recording.A user can download the test results to a USB memory stick or save it to internal memory. The CAT Standard series internal memory can store up to 500 test results (numerical and graphical data). Optional thermal printer prints test results in tabular and graphical form on 80 mm (3.15 inch) paper rolls. CAT Standard series instruments are compatible with DV-Win software. It provides full control of all CAT functions from a PC, as well as acquisition and analysis of test results.
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equipment; dual 1000Base-T Ethernet, one port for LAN connection and the other one for the control of the next generation of LXI instruments. PX32101 can support 4 x4 or two PCIe x8-link, and up to 16GB / s system bandwidth. The ExpressCard 34 expansion slots on the front panel allow users to expand the system modules flexibly. If you install a hybrid multi-slot backplane in the system, then various standard PXI-E and PXI / CPCI peripheral cards could be fitted. In a multitasking environment, PX32101 processor is able to complete multiple tasks independently. The CPU and memory chips soldered with PCB increase reliability performance in shock and vibration environments. Combined with a variety of instrument control interfaces and reliable mechanical & electronic design, PX32101 can meet your hybrid PXIe-based testing for system application requirements perfectly.
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FPGA PXI Digital I/O Card
GX3500
The GX3500 is a user configurable 3U FPGA PXI card which offers 160 digital I/O signals for specific application needs. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.34 Mb of memory. The 3U PXI FPGA card GX3500 can also accept an expansion card assembly which can be used to customize the interface to the UUT – eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Training Board
JT 2156
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Programmable Low-Ohm Meter
DU5210/5211
Delta United Instrument Co., Ltd.
20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, max. test speed up to 80 meas./sec, faster your automation equipment 240*64 Graphic LCD display, can be read the reading clearly and easier. User friendly programmable interface, easy to use Provided RS-232C and Handler combinatorial interface option, to meet your needed
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.