Showing results: 76 - 79 of 79 items found.
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N4372E -
Keysight Technologies
The N4372E lightwave component analyzer helps you with optoelectronic tests with its measurement capability of 110 GHz in an extended wavelength range. It also offers RX testing up to 110 GHz in the full 1260 nm to 1620 nm range. It has a built-in optical power meter that enables you to check and control the operating power. The N4372E lightwave component analyzer's optical transmitter input port connects to an auxiliary tunable laser to verify S-parameters over wavelength.
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HORIBA, Ltd.
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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UC8728 -
UC Instruments, Corp.
UC INSTRUMENTS UC8728 4/8 CHANNEL OPTICAL MULITIPORT POWER METER are PC control multiport passive components power meter test system and offer superior performance for the test of multichannel DWDM, WSS, ROADM, AWG & PLC components and modules, optical amplifiers, DWDM system and other general purpose of multiport fiber optical test and measurement applications. The system can be integrated with tunable laser source, optical attenuator & PDL controller provides a high performance passive components and modules automatic test system platform.
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N4917B -
Keysight Technologies
The N4917B software provides an automated standard compliant stressed receiver sensitivity test according to 100GBASE-LR4, ER4 and SR4 test specification. In order to do this kind of test, several test instruments such as a bit error ratio tester, digital sampling oscilloscope, optical reference transmitter and tunable laser source are required to operate together to achieve a compliant, repeatable optical stressed eye. This stressed eye is then fed to the receiver under test, where bit error ratio is measured under the stress conditions as defined in the standard.
