Showing results: 226 - 240 of 435 items found.
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FilmTek 2000 -
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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M Series -
Introspect Technology, Inc.
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Gemini 180 -
HORIBA, Ltd.
The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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TW3109 -
Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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VUV-VASE -
J.A. Woollam Co., Inc.
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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VC20E Series -
Celadon Systems, Inc.
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Four Dimensions, Inc.
Four Dimensions' Mercury Probe Systems use the liquid metal Mercury to form temporary non-damaging electrical contacts on numerous materials. The instantaneous contact formed on semiconducting materials can be of MOS, MIS, or Schottky barrier type. This permits various electrical characterizations of for example silicon and compound semiconductors without the need of metal deposition processes.
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Maury Microwave Corporation
Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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WinTek s.a.s.
System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
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SPS 2600, SPS 2800, and SPS 12000 Series -
MicroXact, Inc.
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Anfkom International Co.,Limited
3109 optical light source can provide 1 to 4 output wavelengths to meet specific requirements,including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber,as well as other wavelengths according to customer needs.Together with the 3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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HÜBNER Photonics
Due to its non-invasive and non-ionizing properties, terahertz (THz) radiation is unparalleled in its sensing capabilities. Based on state-of-the-art research results, HÜBNER Photonics division developed innovative and highly compact plug & play systems – allowing contact-free detection, characterization and analysis as well as hyperspectral imaging of materials by THz spectroscopy within a few seconds.
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SuperK series -
NKT Photonics A/S
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Hysitron TS 77 Select -
Bruker microCT
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.