Showing results: 316 - 330 of 435 items found.
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N5244B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5245B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5242B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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N5247B -
Keysight Technologies
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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M8290A -
Keysight Technologies
The M8290A is a flexible solution platform for 400G coherent component and transmitter test. It incorporates a 92 GSa/s modular optical modulation analyzer and a 92 GSa/s 4-channel electrical digitizer. Besides these modules an additional arbitrary waveform generator module up to 92 GSa/s, such as the M8196A, can be added to the same AXIe chassis. This setup results in a compact and flexible coherent test solution that can be used together with additional specialized solution software for Integrated Coherent Receiver (ICR) and Analog Coherent Optical (ACO) module characterization.
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781742-01 -
NI
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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FSWP -
Rohde & Schwarz GmbH & Co. KG
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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2200 -
Photon Kinetics
The 2200 Optical Fiber Analysis System provide high-speed characterization of the spectral loss of single-mode and multimode fibers. Configurations include the 2200 for single-mode fibers, the 2210 for both single-mode and multimode fibers, and the 2220 designed for single-mode fiber ribbons. All three systems employ unique fiber preparation and signal processing techniques, which deliver both the measurement performance and the testing throughput required by high volume fiber, cable and component manufacturers. Options are available for mode field diameter and multimode numerical aperture measurements.
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ESDEMC Technology LLC
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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PerkinElmer Inc.
Evolved Gas Analysis (EGA) solutions couple two or more analytical technologies to greatly increase the power of analyses and save precious time by acquiring more information from a single run, creating a powerful and easy-to-use platform for materials characterization. EGA Hyphenation is a powerful tool in the analysis and identification of complex mixtures, both known and unknown, including identifying harmful chemicals in soil, quantitating components in polymers, determining leachables that may contaminate a product's packaging, identifying phthalates in PVC samples and more.
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NED-LMD W-Series -
Gamma Scientific Inc.
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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GT668PXI-40 -
Guide Technology, Inc.
A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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S95083B -
Keysight Technologies
The Keysight S95083B measurement software includes the scalar mixer / converter plus phase (SMC+Phase) measurement class. It provides fully calibrated conversion gain / loss, relative phase, and absolute group delay measurements of mixers and converters without the need for reference or calibration mixers. Eliminating the calibration mixer requires a U9391C / F / G comb generator and an external DC power supply. A vector mixer characterization (VMC) is also included for measuring group delay of frequency-converting devices. VMC can be used to characterize a user-supplied calibration mixer.
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81940A -
Keysight Technologies
Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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E5072A -
Keysight Technologies
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
