Showing results: 2311 - 2325 of 2578 items found.
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Extech EX623 -
Extech Instruments Corporation
This TRMS AC/DC Clamp Meter has dual thermocouple inputs for T1, T2, T1-T2 Differential Temperature measurement plus a built-in Infrared Thermometer with laser pointer for locating hot spots and NCV Detector. Additional features include: DC micro-amp function for flame rod measurements, Diode open circuit voltage of 2.8 Volt, Data Hold plus fast Peak Hold for capturing current surges at motor startup, and capacitance measurement to 40mF. Comes complete with test leads, 9 Volt battery, two Type K bead wire Temperature probes and carrying case.
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TetraTek Products, Inc.
World-class integration of electronic test equipment, instrumentation, test fixtures, automation, load simulation,data acquisition, and software . In partnership with two major leaders in high-technology automation, three very capable machine shops, a custom cabling company, a rapid prototype circuit board fabrication house and two large automated sheet metal manufacturing facilities we offer custom process and test equipment designed and manufactured for convenience and precision. Each component of our systems is carefully consideredto provide you with maximum performance consistent with easy maintainability and long term return on your investment.
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Corelis, Inc.
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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JW8006 Series -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
SLED(Super luminescent light-emitting diode) is a super broadband optical source which is designed for fiber sensor;, optical fiber gyroscope, lab application field. It has the feature as broaden bandwidth, customizable center wave length, high output power, etc. Benchtop (for lab), standard module(150*125*20mm, with modulation function) and mini module(90*70*15mm) is available. The key component is employed the FWHM bandwidth up to 40nm high power SLEDs to ensure the spectrum performance. Stability is ensured by unique ATC and APC circuit. The output power is adjustable by RS232 or RS485 port.
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Vishay Intertechnology, Inc.
Combining multiple functions in a single IC, Vishay smart load switches eliminate the need for external circuitry . A simplified GPIO interface allows for power distribution and sequencing of multiple sub-systems. Slew-rate-control devices provide a controlled supply ramp to reduce inrush current, while fault protection and isolation switches increase robustness with reverse current, overtemperature, current limiting, and short circuit protection features. The ICs offer quick output discharge and small footprints, while their integrated design saves PCB space compared to discrete solutions, reduces BOM counts, and lowers manufacturing costs.
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XD71 -
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Freese Enterprises Inc.
Freese Enterprises (FEI) has vast experience, in many industries, in the custom design and construction of physical test fixtures to consistently test a feature or operation of a device or piece of software. FEI can develop test solutions for modules or fully assembled products such as key fobs, RF filters, and cell phones - from complex integrated circuits and custom electronics to automotive components and RF communication devices. In general, the advantages of FEI test fixtures include the separation of the test initialization and destruction from the testing, reusing a known state for more than one test, and assumption by the testing framework that the fixture set-up works.
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AutoSIR2™ -
Gen3 Systems Limited
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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18C & 19C -
Picoprobe
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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783124-02 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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2811 LP -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.
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1651 IN -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● ACV auto-detection function on 3 insulation ranges (250/500/1000V) and low Ω ragne before pressing the TEST button.● 68 x 34mm large LCD display.● 3½ digital LCD (2000 counts) a LCD indicated instrument for insulation(MΩ), continuity (Ω) and AC voltage.● Three insulation test voltages(DC V) : 250V, 500V, 1000V.● Auto ranging.● Auto power off function.● Auto data hold function.● Rel function (ohm only)● Continuity buzzer.● External AC voltage warning.● Automatic circuit discharge.● BS 16th edition.
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783124-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-01 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.