Showing results: 2386 - 2400 of 2618 items found.
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Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Entes Elektronik
LV power capacitors are circuit elements which compensate the inductive reactive loads on a system. Being able to connect and disconnect up to 100 times a day in accordance with load variations in automatic reactive power compensation systems really speaks for the quality and endurance and capacitors. Upon connection/disconnection instances, currents which have higher values than the nominal value may occur on reactive power compensation capacitors. ENTES ENT.C series power capacitors are designed to withstand the severe and poor conditions which may shorten the operating life during reactive power compensation. This endurance is the result of advanced engineering and long-term test procedures.
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SystematIC
In our world of smart appliances sensing the physical aspects of our environment is key: we like to know (measure) temperature, sunlight, position, distance, pressure and so on, and use that information in our (control) systems. For that data to be processed the (analog) physical signals need to be converted to electrical signals: the function of the sensor. An integrated (smart) sensor can do this and when realized in semiconductor technology can be mass-produced at low-cost. With our analog IC design expertise we have been involved in the development of many sensor readout circuits. But we also take care of integration of the related signal processing such as high resolution AD conversion and the digital interfacing.
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SL Power Electronics
Test and measurement equipment can be particularly affected by the quality and performance of power supplies. Electrical noise is a major concern because the speed and accuracy of test equipment rests greatly on its ability to minimize noise and keep it away from the sensitive electronics which sample and report the data that the equipment is designed to measure. Test and measurement systems may be used for validating electronic circuits, testing electronic equipment, analyzing chemical substances, monitoring environmental conditions, or testing discrete components. Test equipment may be portable, in laboratories or on production floors so the environment where the equipment can be used is also critical when selecting a power supply.
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SCR ELEKTRONIKS
The tests are Performed as Prescribed in IS the Panel Carries out high voltage, open circuit and performance tests, one by one and provides indication of the Test results as PASS or FAIL lamp for high voltage test. It is very useful and handy in line testing on Mass production line as well as type Testing. Special fixture can be provided for the specific product. This avoids the connections & disconnections of the product for different tests. The total time for entire testing is less than 80 seconds. Micro controller based sequential timer maintains the sequence of operation and displays the test status. The entire system is housed in sturdy M.S cabinet with powder coating.
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UTP 6010 RF -
NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Hilkar
Crowbar resistors are three phase resistance banks which are connected to the rotor windings of the DFIG (Doubly-Feed Induction Generator) such as wind power generator. They are used to prevent damage to the inverter circuits attached to rotor side when a fault occurs in the grid. DFIG power converter, which has a restricted over-current limit, needs special attention during faults in the grid. If the rotor current or DC link voltage reaches the threshold value, crowbar resistors disconnect the converter in order to prevent the generator turning into a squirrel cage induction machine. By crowbar resistors, the DFIG could stay connected to the grid and continue its operation.
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OPT 80 -
Unaohm Start S.r.l.
Calibrated measurement of the optical power of satellite and terrestrial TV signals distributed in optical fiber Calculation of optical signal losses on distribution Measurement of digital parameters (BER - MER - NM etc.) of optical signals converted into RF Visualization of optical carriers in RF Field Metric Spectrum Analyzer Power Meter Optical Field Meter Display Optical RF Power Supply Line Link Meter (LNB power supply ) Optical LNB power supply 13V 500mA with short circuit and overload managementAcquisition of optical measurements using the field meter Data Logger Option: certification of the OPT80 calibration and optical power measurements
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4153 IN -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Measures Insulation Resistance, voltage (AC-DC) measurements with automatic hold facility, diode, ohm, and continuity with a short circuit current of minimum 220mA.● Auto-off function.● Energy conservation feature.● Ener-Save™ limit the test duration to about 10 Seconds.● Quick Test and EnerSave™ are unique features. Both saves energy.● No moving parts. All calibration are saved internally in a non volatile memory.● Easy calibration at any facility around the world.● Operates with rechargeable batteries, alkaline or low cost general purpose batteries.● Low cost maintenance, calibration, and ownership.● Complies to all the latest regulations, including UK.
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213 HVD~226 HVD -
Standard Electric Works Co., Ltd
● Excellent shock resistance.● Rugged nylon moulding.● Auto on (when voltage detected).● Excellent drop resistance.● Good vibration resistance.● Loud sound alarm indication.● Built-in proving and self-test circuit.● High bright color-coded LEDS.● Works from standard 9V battery.● Interchangeable contact electrode.● Use in all whether conditions.● Compatible with all link sticks.● Lightweight, robust & compact.● Models available from 11kV to 132kV.● Suitable for indoor and outdoor use.● Self(auto on) or manual arming.● Easy access to batteries.● Customized threshold on demand.● Auto off (if no voltage detected).● Waterproof design, protection class : IP65.
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784745-01 -
NI
The REM-11175 is a digital output module for remote I/O. Remote I/O systems are low-cost, modular systems for simple machine control and measurements. A remote I/O system consists of an EtherCAT bus coupler and … individual modules mounted on a DIN rail. You control the REM-11175 from a real-time controller, such as a CompactRIO Controller or an Industrial Controller. You can use remote I/O hardware to add low-cost I/O for simple tasks while your controller handles advanced tasks such as image processing, motion control, and high-speed or specialty measurements. The REM-11175 features 2- and 3-wire spring terminal connection methods and circuit and overload protection.
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PZ2121A -
Keysight Technologies
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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781215-01 -
NI
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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PZ2120A -
Keysight Technologies
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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779670-00 -
NI
The PXI‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
