Showing results: 271 - 285 of 790 items found.
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National Technical Systems
Compression testing is a very common testing method that is used to establish the compressive force or crush resistance of a material and the ability of the material to recover after a specified compressive force is applied and even held over a defined period of time. Compression tests are used to determine the material behavior under a load. The maximum stress a material can sustain over a period under a load (constant or progressive) is determined.
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610138109 -
Virginia Panel Corporation
Primary mating contact 610138216. (May mate with other ITA contacts, as well.)Available in twin-female, crimp/solder, twin male, and wire-wrap design, QuadraPaddle contacts are engineered for flexible interconnect options. Rated at 5 amps continuous (1250 VAC) with a 2-ounce insertion force, QuadraPaddle contacts provide 4 reliable points of contact per pin, outstanding electrical performance, and low mating force.
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3690-15 -
VECTOR Electronics and Technology, Inc.
Contact fingers at the other end of extender card are gold plated provides low insertion force and positive contact with printed circuit boards.
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Merica Series-MPA50 -
Merica Technology Ltd
Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 122gf(4oz)
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Merica Series-MPAL50 -
Merica Technology Ltd
Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 185/227gf(7/8oz)
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Supracon AG
The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
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ML-TCM Series -
Mirae Corporation
ML-TCM series has the most improved drive force by applying laminated core inside the Mover. ML-TCM series is designed for use on Chip-Mounters
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"Eddy" -
Anfatec Instruments AG
„Eddy“ is an Atomic Force Microscopy system for student's education. It bases on the approved Level AFM setup and includes a full sample set and a large cantilever set.
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esmo AG
optimized distribution of force allowing smooth and easy operationsminimized footprint/floor space in relation to manipulator load capacitymodular configuration ensuring "the perfect fit"
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Micro Power -
Virginia Panel Corporation
Rated to 10,000 cycles.Rated to 21 Amps cont w/ 12 AWG wire.Max contact resistance of 1.5 mOhms.Mating force of 2 lbs.
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Lansmont Corporation
Compression testing is a mechanical procedure for determining how a test sample will react to a force being applied across one side of the test sample.
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Anfatec Instruments AG
Vista-IR combines AFM with IR (AFM-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-10 nm spatial resolution. Its patented photo-induced force microscopy (PiFM) measures the near-field optical response of the sample via mechanical force detection, making the technique robust and easy-to-use. Reliable and repeatable PiFM spectrum from 10-nm region provides “nano-FTIR” spectrum in less than a second.
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IMADA, Incorporated
Manual test stands offer basic force testing and economy.Lever models enable rapid testing of compression or tension, up to 220 lbf.Wheel-operated test stands enable precise control for either compression or tension and the force gauge remains in position when the wheel is released. Wheel stands are offered in a wide range of capacities from the 11 lbf capacity micro-movement stand up to 750 lbf models.