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EFT Immunity Measurement
EFT61000-4
EFT immunity tester EFT61000-4 is specially designed according to the characteristics and requirements of EFT measurement and it is an ideal disturbance source of EMS measurement. They have fine performance, such as high stability, high reliability, easy to use etc. It meets the standard requirements of IEC 61000-4-4, EN 61000-4-4, GB/T17215.301, GB/T17215.322 and GB/T17626.4. EFT61000-4 has LCD display in both English and Chinese.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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10G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to10Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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2.5G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to 2.5Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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25G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to 25Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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25G Febry-Perot Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s FP lasers are designed for operation up to 25G, and are targeted at 4G and 5G Fronthaul applications. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability and have the following benefits : *Etched Facet Technology enabling high performance and product uniformity*Industrial temperature operation from -40ºC to 95ºC, ideally suited for 4G and 5G fronthaul applications*Non-hermetic capability suited for low cost or datacenter applications*High back-reflection rejection, enabling low cost packaging without the need for isolators
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring u...show more -
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Electric Fatigue Testing Machine
EFT Series
Jinan Testing Equipment IE Corporation
EFT series electric fatigue testing machine is an ideal platform to test a variety of materials and components for the following high demanding tests: Quasi-static test; Reverse-stress mechanical low cycle fatigue loading tests (LCF); High temperature creep, stress-rupture, relaxation tests in load/strain control mode for medium-term or long term period. Mechanical fracture tests like crack growth & toughness tensile/compression test for ceramics in both room- or vacuum-, high- temperature...show more -
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Steering Diodes
ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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Ultra-Compact Immunity Tester
AXOS5
The AXOS5 is an ultra-compact immunity tester that performs all the most commonly used transient immunity tests, including Surge, EFT, Dips/Interrupts and AC/Surge Magnetic Field. The simplified user interface provides quick selection of tests and test levels, and even lets you change test parameters “on the fly” while running a test.The actual EUT power mains voltage and current are indicated in the display. Using the Electronic-Fuse function, the user can set an upper limit for EUT power mains...show more -
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Ultra-Compact Immunity Tester
AXOS8
The AXOS8 is an ultra-compact immunity tester that performs all the most commonly used transient immunity tests, including Surge, EFT, Dips/Interrupts and AC/Surge Magnetic Field. The simplified user interface provides quick selection of tests and test levels, and even lets you change test parameters “on the fly” while running a test.The actual EUT power mains voltage and current are indicated in the display. Using the Electronic-Fuse function, the user can set an upper limit for EUT powe...show more
