Showing results: 391 - 405 of 966 items found.
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SecuControl inc.
FTL testblock with dust cover and current disconnect pinThe FTL is a test block for interfacing substation devices (protection relays, fault recorders, revenue meters, ... ) to the voltage and current transformers and to other equipment on the system side of a power grid. The FTL test block uses disconnect pins to isolate the substation devices from the system side equipment. Once isolated, secondary injection can be performed using banana jacks on the front side of the test block.
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i-iX Series II -
AMETEK Programmable Power, Inc.
The iX Series II represents a new generation of AC and DC power source that addresses increasing demands on test equipment to perform more functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the iX Series II systems are capable of handling complex applications that have traditionally required multiple instruments.
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Mercury Systems, Inc.
High-power, rackmount amplifiers utilize advanced power combining techniques to achieve high output power levels. These integrated amplifiers include advanced cooling capabilities and other customizable features. Though a focus on modularity, these rackmount amplifiers are ready for easy integration into a larger system or lab test bench.
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N6900 Series -
Keysight Technologies
The Advanced Power System (APS) N6900 Series power supply is ideal for automated test equipment (ATE) applications where high performance is critical. Adding any combination of the four performance options will increase performance where you want it most. Versatility has never been faster.
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ELMA Electronic, Inc.
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To compliment our wide range of systems, Elma offers a comprehensive range of system level accessories, including: I/O solutions, HMI displays, system/power management controllers and test & development boards.
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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LPDDR4 and LPDDR3 -
Triad Spectrum, Inc.
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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N3600 Series -
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.
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YAV90PIN -
6TL Engineering
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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6U VME 6021 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation, it combines superior mechanical quality with lowest noise power supply technology.
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6U VME 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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9U VME64x 6021 -
W-IE-NE-R, Plein & Baus GmbH
WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for VME/VME64x bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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DAQ -
Mars Labs LLC
Titan Data Acquisition (DAQ) Systems offer universal signal conditioning, low power consumption, convenient SD card storage, and easy-to-use software. Systems can be purchased as a complete test kit, including custom cables and accessories. Titan products are designed and built in the US.
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9U VME64x 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for VME/VME64 bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.