Showing results: 1 - 9 of 9 items found.
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Tokyo Electronics Trading Co., Ltd.
Charged Device Model (CDM) is to simulate a discharge to metal from any metal terminal of a charged electronic component or from metal tool held by a charged human body to metal terminal of an electronic component. CDM discharge causes very fast charge transfer, and then component is damaged by the stress. The CDM test system analyzes the robustness of component against CDM stress.
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Electro-Tech Systems, Inc.
Our equipment helps users characterize ESD susceptibility levels for electronic and pyrotechnic devices, liquids, and powders from 5V to 30kV. ESD simulations support Human Body Model (HBM), Charged Device Model (CDM), Machine Model (MM), and Human Metal Model (HMM) waveforms.
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Ecdm-100E/400E -
Tokyo Electronics Trading Co., Ltd.
Ecdm Series is an inexpensive and manually controlled bench-top ESD simulator. By replacing an external probe or adaptor, every ESD event such as Human Body Model (HBM), Machine Model (MM) and Charged Device Model (CDM) including FI-CDM and Direct charging CDM can be simulated.
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ISE Labs, Inc.
Service: Field-Induced Charged Device Model (CDM). Simulates triboelectric and electrostatic charging/discharging events that occur in production equpiment and processes. Human Body Model (HBM). Simulates electrostatic discharge that might occur when a human touches the test device. Machine Model (MM). Simulates electrostatic discharge that might occur when a conductive object comes into contact with the test device. Latch-Up/Electrical Overstress.
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Multiline -
PASI srl
The MultiLine® meters are in a class of their own:
3 models with one, two or three universal channels measure every parameter either sequentially or simultaneously. Every model possesses a brilliant color graphic display, two USB interfaces (USB-A and Mini-USB), and rechargeable batteries that can be charged directly in the device.
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Evans Analytical Group®
EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Kasuga Denki, Inc.
probe-type charge meter that can easily measure the amount of discharge charge that causes static electricity destruction in the manufacturing, inspection, and assembly processes of electronic devices.Many ESD phenomena that impair electronic devices are represented by the CDM ( Device Charging Model). The CDM is a model that represents a phenomenon in which a high peak current flows at high speed when the device itself is charged and its external electrode is grounded. The coulomb meter measures the amount of discharge charge, which is the integral value of the current, with high accuracy.
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MASER Engineering B.V.
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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ESDEMC Technology LLC
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).