Showing results: 1966 - 1980 of 2716 items found.
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Audacix
Cyber security testing is often also referred to as pen testing or penetration testing. Such tests validate the cyber security defences of your applications, network infrastructure and even your team members. Our cyber security testers are highly trained and certified ethical hackers.
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Keysight Technologies
Reliable and repeatable switching is critical for your measurement accuracy whether you use switching to route signals for design verification applications or for complex automated functional test systems. Keysight's switch measure mainframe and modules help ensure confidence in your measurement results.
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Keysight Technologies
A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.
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System 1808 -
Pulse Instruments
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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UC9710xx -
UC Instruments, Corp.
The UC8710C, UC9710L and UC8710CL tunable laser modules offer superior performance in testing DWDM components, AWG & PLC components, and optical amplifiers, and performing other general- purpose fiber optical test and measurement applications particularly in fiber grating sensor fast sweep testing.
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GM82009xx -
UC Instruments, Corp.
The GM82009C, GM820093L and GM82009CL tunable laser modules offer superior performance in testing DWDM components, AWG & PLC components, and optical amplifiers, and performing other general- purpose fiber optical test and measurement applications particularly in fiber grating sensor fast sweep testing.
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Intepro Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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6U VME 6021 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation, it combines superior mechanical quality with lowest noise power supply technology.
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6U VME 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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9U VME64x 6021 -
W-IE-NE-R, Plein & Baus GmbH
WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for VME/VME64x bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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9U VME64x 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for VME/VME64 bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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780319-02 -
NI
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-03 -
NI
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-01 -
NI
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Nordson Corporation
The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consuming micro-section analyses needed and / or assists in identifying where micro-section preparation and investigation must concentrate. Available with a system order or as retro-fit to suit application and workflow needs.