Showing results: 361 - 375 of 2716 items found.
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TVAC 7000 -
WinSoft Inc.
Equipment used in space applications needs to go through stringent environmental tests in order to prove that it can survive the extreme conditions experienced during launch and while in space. Some of the key environmental tests include vibration, thermal vacuum, and electromagnetic compatibility. Thermal vacuum test is crucial to confirm the equipment is able to operate under the space vacuum condition.
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Eagle MTS180 -
Digitaltest GmbH
The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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McCabe -
McCabe Software
McCabe IQ Test Team Edition provides comprehensive test / code coverage to focus, monitor, and document software testing processes. Using industry-standard testing methods and advanced dynamic analysis techniques, McCabe IQ Test Team Edition accurately assesses the thoroughness of your testing and aids in gauging the time and resources needed to ensure a well-tested application.
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QACraft
As Android apps have become a valuable tool to target more audiences and boost sales, it is vital to have an application that is robust, engaging, and works efficiently with maximum capacity. We at QACraft test all the essential parameters of your android app to ensure that the application is up to the standards and works well to serve the purpose. Our detailed report and several test reports have made us the number one choice in android app testing services in the USA. We have also helped many clients globally to test their android applications for a better business and an improved experience for all the users. Our team makes sure that the app works with high speed without any bugs delivering the topnotch user experience.
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LXinstruments GmbH
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Cortek Test Solutions
Cortek Test Solution’s design capabilities range from very basic to extremely sophisticated solutions. Developing custom test fixtures demands more engineering time as well as an in-depth knowledge of mechanical design, pcb test methods paired with precision machining. Our experienced engineers will evaluate your requirement and design innovative mechanical test fixtures to meet your application needs in both the R & D and production environments.
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N4370P01A -
Keysight Technologies
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
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IT-25B -
Clinton Instrument Company
While most military standards now favor high frequency spark testing over impulse spark testing, the IT-25B Impulse Spark Tester is available for use in some aeronautic applications that still specify the impulse method. The IT-25B meets the test requirements of military specifications MIL-C-13777E, MIL-W-16878, and NEMA standards for hook-up wire used in high temperature wire applications. This method is favored as an alternate to a wet dielectric test.
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50-295A-021-5/16 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-121-6/24 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-121-18/8 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-021-3/24 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-021-10/8 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-021-5/12 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-295A-121-10/16 -
Pickering Interfaces Ltd.
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
