Showing results: 2521 - 2535 of 2843 items found.
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BCO, Inc.
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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2291 -
Georg Fischer Signet
The 2291 Guided Wave Radar level transmitter is designed for continuous level measuring of conductive or non-conductive liquids, pulps and solids. The 2291 level gauge operates based on the well-known TDR (Time Domain Reflectometry) principle. Micropulses are sent along a probe guide at the speed of light. As soon as the impulse reaches the surface of the medium, it is reflected back to the electronic module. Level distance is directly proportional to the flight time of the impulse.
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InfraScan™ LTM -
Checkpoint Technologies, LLC.
Checkpoint Technologies' laser probing tool, the InfraScan LTM (Laster Timing Tool), employs a cw laser to optically probe circuit node to produce electronic waveforms. Checkpoint Technologies' stabilized laser source and optical-to-electronic conversion module provides high bandwidth optical probing up to 12 GHz. The LTM can be integrated into an existing InfraScan product such as an INV or TDE or installed as a stand alone system.
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NOVOTEST IPSM-U+T+D (Pulse Velocity Tester) -
NovoTest
The pulse velocity tester IPSM-U+T+D allows to measure the strength and homogeneity of the concrete, bricks and other materials under the composition and surface sounding in products and designs for construction projects, inspection of buildings and structures, according to ASTM C597-16 (Standard Test Method for Pulse Velocity Through Concrete). Has the determining of the depth of cracks by the surface sounding probe function and also flaw detection mode (A-scan).
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IMADA, Incorporated
These automated food testers are designed for clean, smooth trouble-free operation.Food Rheology testers automatically test firmness, elasticity or viscosity using a load cell combined with programmable movement control. The easy-to-use program dial and menu screens control probe positioning and speed. Select from three movement patterns. The USB port streams 1,000 force data/second to the Force Data Analysis Software (included).
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Siborg Systems Inc
LCR-Reader-MPA combines tweezer probes with a powerful LCR/ESR-meter that is able to determine the type of component and best test parameters before measuring with a 0.1% basic accuracy. The device will display the main impedance value, any secondary values such as ESR, Q or D, component type and test parameters used instantly on a bright backlit LCD display. The 1 oz. device is very portable and ideal for fieldwork.
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ProntoTEST-FIXTURE -
Unisoft Corp.
In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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VOT-50 -
Standard Electric Works Co., Ltd
● Voltage test: 12V to 690V AC/DC (7 LEDs) with indication by buzzer.● Voltage range: 12V, 24V, 50V, 127V, 230V, 400V, 690V.● Polarity test: LED +/-● Audible continuity test● Self-test button to ensure proper function of the device prior to testing.● Waterproof design, protection class: IP54● Phase / Neutral identification● Integrated storage clips for test probe.● Rubberized injection molding.
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186 CB -
Standard Electric Works Co., Ltd
Cable Tracer● Trace wires or cables.● Volume control.● Tip & Ring identification.● 2 bi-colored LEDs ( Line 1 & Line 2).● Tone speed selection : Fast & Slow.● A phone jack is designed for headset or handset. (Amplifier probe)Digital Multimeter● 4000 counts.● ACV, DCV.● Ohm, Diode, & Continuity testing.● Auto-range.● Data hold.● Low battery indication.● Select function.● Auto-off.
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IST 5800/5850 -
IST Information Scan Technology, Inc.
The IST-5800 series programmable multifunction generator is an exceptionally versatile and economical instrument for applications in R&D, Manufacturing Test, Service Repair and Training. Featuring an adjustable triple output power supply and waveform generator, it has the ability to provide power and signal sources for a circuit while the universal logic probe, auto-ranging frequency counter, and digital voltmeter allows you to simultaneously analyze and measure circuit activity.
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5047 -
Abaco Systems Inc
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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PinMap™ -
CAMI Research Inc. (CableEye®)
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large library to match your connector. Then touch the tester probe to the connector pins one-by-one to automatically detect and assign a test point to each pin. A synthetic voice reads probed pins as you touch them so you don’t need to take your eyes off the connector you’re probing. Finally, enter pin labels of your choice if you wish to override the standard designations.
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Keysight Technologies
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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AT-2030 -
Agate Technology
The AT-2030 portable calibration shaker table is designed for simple accelerometer and vibration transducer calibration without the need for advanced features. AT-2030 shaker table and vibration calibrator is a variable frequency, variable amplitude, battery operated portable shaker capable of calibrating accelerometers, transducers, and proximity probes. Applications are producing a known vibration signal in g’s, mils, or ips for sensor, wiring, instrumentation, and system checkout in vibration condition monitoring applications.
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AM3200-Series -
Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
