Showing results: 436 - 450 of 2843 items found.
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Parrot Invent
Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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Pilot 4D M4 -
SEICA SpA
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
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Electro-Tech Systems, Inc.
Surface and/or volume resistance measurements are key parameters in describing materials' electrical properties. ETS offers a variety of probes to support numerous industry requirements and applications.
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ACR Systems Inc.
For applications where the center of the temperature sensing point will be approximately 0C(32°F). The temperature sensor is housed inside a stainless steel probe for fast response time.
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Model EMPX-HF -
Lake Shore Cryotronics, Inc.
The Model EMPX-HF is a versatile cryogenic electromagnetbased micro-manipulated probe station used for nondestructive testing of devices on full and partial wafers up to 25 mm (1 in) in diameter.
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Model CPX-VF -
Lake Shore Cryotronics, Inc.
The Model CPX-VF is a versatile cryogenic micromanipulated probe station used for non-destructive magnetic testing of devices on full and partial wafers up to 51 mm (2 in) in diameter.
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CX-500 -
Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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MPI Probe Card Technology
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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TA288 -
Tenma
A multi-purpose thermometer for your laboratory, workbench or office. Simple to use and provides a clear digital readout in °C or °F. a sharp and sensitive metal probe, and a protective plastic sheath
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TP3207P -
Delta OHM S.r.L.
Temperature probe, Pt100 sensor, for measuring floor temperature (diameter Ø 70 mm, height 30 mm). Cable length 2 metres. Equipped with SICRAM module.
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AP472S1 -
Delta OHM S.r.L.
Vane probe with K type thermocouple ∅ 100 mm to measure air speed in the range 0.6…25 m/s and air temperature in the range –25°C … +80°C.
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LP471UVBC -
Delta OHM S.r.L.
LP471UVBC is a radiometric probe for measuring irradiance (W/m²) in the 210…355 nm spectral range with peak at 265 nm. It is equipped with a connector with SICRAM module and a 2 m cable
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MBP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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FLP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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EverBeing Int'l Corp
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.