Showing results: 511 - 525 of 2843 items found.
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Guided Wave
The sample interface is a virtual “windows into the process” and is a critical component of any optical analyzer system. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV/Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal transmission for long-term reliable measurements.
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N1501A -
Keysight Technologies
The Keysight N1501A dielectric probe kit with N1500A materials measurement software suite with Option 004, and a Keysight network analyzer, determines the intrinsic electromagnetic properties of many dielectric materials. Because these properties are determined by the molecular structure, they can be related to other properties of interest as well. Measuring them can provide critical insight into applications in many industries.
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P-20 Series -
Auburn Technology
The P-20A is a PASSIVE 10:1 RF VOLTAGE PROBE with a 50 Volt DC BLOCK built in. It has been designed to allow users of RF test equipment to use standard signal tracing techniques. The P-20A makes it possible to conveniently and accurately monitor or inject signals up to 3 GHz into RF circuits without significantly loading or detuning them.
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6HP-9060 -
Prokit's Industries Co., Ltd.
Switchable X1/X10/X100 attenuation with reference switch positions. Break-resistant center conductor & wide compensation range. Flatter response, sharper leading edges. Faster rise time and replaceable cable probe head tip and ground lead. Max. input voltage: 600V/1200V (DC-peak AC). Includes BNC adapter, IC tip, insulating tip & trimming tool.
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FA1817 -
HIOKI E.E. Corp
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Pilot 4D V8 -
SEICA SpA
The Pilot 4D V8 represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume, test coverage and flexibility, for prototyping, manufacturing, or repairing any type of board. Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.
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Translarity
Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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400-02 -
Srico, Inc.
Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.
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FS2600A -
FuturePlus Systems
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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U4322A -
Keysight Technologies
Keysight's PCIe 3.0 analyzer uses Keysight's unique ESP (Equalization Snoop Probe) technology, with the ability to tune the equalization algorithm used according to the type of channel the analyzer is monitoring. This ensures that the data captured in the analyzer is exactly what is on the wire. Without this capability, at 8GT/s, there is a high likelihood of misrepresentation of the data on the bus, which can lead to wasted hours, if not days in the validation cycle.
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250 SSP -
Aines Manufacturing Corp.
This probe is designed for those technicians that want the best tool available. The Model 250SSP is supplied with a cone-shaped tip and a duckbill tip that is longer and flatter, permitting insertion into larger cables, or cables under tension where slack cannot be obtained. Another feature is the built in speaker for audio without the need for a butt set or headset. The speaker is operated by a slide switch that has a "lock" position for continuous monitoring.
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Condor MTS 505 -
Digitaltest GmbH
Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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DI-1000 -
Lightel Technologies, Inc.
The ergonomically designed DI-1000 is Lightel’s all digital video microscope probe. It connects directly to your PC through the computer’s USB2.0 port. Featuring easy single finger focusing, a built-in image freeze/capture button, and detectable resolution to 0.5µm, the DI-1000 package includes our free ConnectorViewTM (standard) software, providing digital zoom, image display, image capture, auto-calibration and basic analysis tools.
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FuturePlus Systems
The DDR4 DIIM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR4 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR4 signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR4 Address, Command and Control bus. Solder down N5541A analog probes purchased separately from Keysight Technologies.
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FuturePlus Systems
The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR3 Address, Command and Control bus. Solder down N5381B analog probes purchased separately from Keysight Technologies.
