Showing results: 526 - 540 of 2843 items found.
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SuperTrace Probe -
Green Hill Software, Inc.
Green Hills Software's SuperTrace Probe v3 can capture up to 4 GB of trace data at clock speeds up to 1.2 GHz (trace port speeds over 300 MHz). These capabilities combine with the TimeMachine Debugging Suite of trace analysis tools to enable you to: Fix bugs faster, Optimize with ease, Test with confidence. Captures up to 4 GB of trace data, enabling analysis of hundreds of millions of instructions
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FS2520 -
FuturePlus Systems
The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.
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Arrow Tech
Probe has a mica window that has a thickness of 1.8 to 2.0 mg/cm2. This allows detection of alpha radiation as low as 3.0 MeV when in close proximity to the window. Beta radiation in excess of 35 keV and X-ray or gamma radiation greater than 6 keV can also be deteched. The detector is provided with a BNC connector. It can be used with most count rate and survey meters which accept Geiger Mueller (GM) detectors operating at 900V DC.
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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IkaScope -
Ikalogic s.a.s.
IkaScope is a wireless oscilloscope probe. It fits perfectly in your hand and works with any connected screen, like a laptop, a tablet or smartphone. Thanks to ProbeClick® technology, IkaScope knows when to measure and when to hold. IkaScope transfers measured signals over high speed wifi connection. 200 MSa/S Sampling rate. 30 MHz Bandwidth. 80 Vpp Input range. AC/DC Coupling. 4000 ptsMemory. 200 FPS Max. refresh rate.
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Smartech Inc.
• Inductive measuring probes specially designed for measurement by comparison• Available in 2 versions: spring push and pneumatic push• Long life precision bearing guidance (tested up to 13 million cycles)• Resolution <0.0001 mm• Repeatability 0.15 μm• Measuring range +/- 2mm and +/- 5 mm• Compatible with D300SV2, D70i and D400S units through M-Bus multiplexer units• High data speed• Operating temperature +10 to +80°C• IP65 protected
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MPI Probe Card Technology
The Osprey probe card is MPI’s solution to demand for ever finer pitch. It is designed for smaller Al pad, and is ideal for tiny pitch application with peripheral and full array pattern. With precise alignment and better planarity control, Osprey can reach higher productivity by multi-DUT design. The forming wire (FW) type needle produced with MPI’s own micro fabrication process not only delivers high-quality performance but also allows easy needle replacement and shortens maintaining cycle time.
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Anritsu Corporation
With today's high data rates and high definition services, connector quality and inspection has never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.The Video Inspection Probe (VIP) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions.
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FIP-920 -
SYOPTEK INTERNATIONAL LIMITED
FIP-920 Fiber Optic Inspection Probe combines a 3.5” high definition TFT LCD display, provides a detailed image of fiber end-face, zoom in/out feature make it easy to identify the smallest particles, scratches. With the attached SD card memory, you can capture/record the live end-face image, the image file can be reviewed/transferred via SD card reader or USB cable. Up to 8hrs battery working make it possible to inspect the fiber end-face at any time and any place.
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Tektronix, Inc.
The IsoVu Measurement Systems can make nearly impossible measurements – like high-side Vgs- a reality, providing today’s power engineer with measurement insights not available in other power systems and instruments. When performing near-impossible measurements, especially in those involving Gallium Nitride (GaN) and Silicon Carbide (SiC), it can be extremely time consuming and cumbersome. IsoVu eliminates those concerns: IsoVu probes offer better common mode rejection and higher bandwidth for high EMI environments and on power FETs like SiC and GaN.
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Dynamic Test Solutions
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Pilot 4D L4 -
SEICA SpA
The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).
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EPMA -
JEOL Ltd.
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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EPMA-1720 -
Shimadzu Corp.
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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JXA-8530FPlus -
JEOL Ltd.
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
