Showing results: 46 - 60 of 2843 items found.
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RjP-600 Series -
Laser Probe Inc.
The RjP-600 Series energy probes integrate the detector and preamplifier in the same enclosure, thereby maximizing signal integrity between the detector and preamplifier. This permits longer cable runs between the probe and instrument, as is often necessary in production environments. Probe specific information, like calibration date and wavelength response curves, is stored in the probe for access by the instrument. Other features include interchangeable filter holders and ¼-20 mounting hole.
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MICRONICS JAPAN CO.LTD.
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Nexus Technology, Inc.
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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RkP-400 Series -
Laser Probe Inc.
The RkP-400 Series probes consist of a compact head containing the detector and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1” (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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RjP-400 Series -
Laser Probe Inc.
The RkP-400 Series probes consist of a compact detector assembly, or head, and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1" (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Yokogawa Test & Measurement Corp.
Current probes allow you to measure DC or AC current. Yokogawa's selection of current probes allow measurements ranges up to 500 ARMS and bandwidths up to 100MHz.
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Yokogawa Test & Measurement Corp.
Logic probes allow you to capture signals using the logic portion of a mixed signal instrument. Yokogawa offers low and high voltage, isolated and non-isolated logic probes.
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DCP-BTA -
Vernier Software & Technology, LLC
The Current Probe measures DC and low-frequency AC currents up to 600 mA. Use Current Probes in combination with Differential Voltage Probes to investigate Ohm's Law and explore series and parallel circuits. The 0.1 shunt resistor minimizes changes to your circuit. If currents will exceed 1 A, use the High Current Sensor.
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M12PP -
CAPRES A/S
CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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KHZ43201 -
Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.