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Showing results: 7996 - 8010 of 8450 items found.

  • Oscilloscopes

    Scientech Technologies Pvt. Ltd.

    Oscilloscopes are essential tools for anyone designing, manufacturing or repairing electronics equipments. In today''s fast paced world, engineers need the best tools available to solve their measurement challenges quickly and accurately. Scientech Oscilloscopes are the key to meet today''s engineer measurement challenges. Today, Scientech Technologies is a prominent figure in the market as an Oscilloscopes manufacturer and supplier. It has built a big territory of oscilloscopes implementing all the newfangled techniques. These Oscilloscopes are the finest solution for quick analysis, faster debugging and testing of your newest designs. Scientech as an oscilloscope manufacturer has gifted researchers, professors and students with the first-rate model of scope for various test & measurements and laboratory experiments.

  • Light Sources

    Inframet

    There are many low cost artificial light sources used for illumination or for industrial applications: tungsten or halogen bulbs, fluorescent lamps, LED lamps etc. Some of these sources have regulated intensity of emitted light. However, there very few calibrated light sources of precisely known parameters. A light source can be considered as calibrated when its user can precisely regulate its photometric/radiometric parameters like luminance (or illuminance), radiance (or irradiance) at defined spectrum of interest. Such light sources are needed in many applications among them, in systems for testing night vision devices, VIS-NIR cameras and SWIR imagers. Inframet offers a series of calibrated light sources that can be divides into three groups:

  • Transformer Winding Resistance Tester

    KRI 9310 - Kingrun Instrument Co., Ltd.

    KRI 9310 adopt Kelvin four-wire testing method, which effectively eliminates the influence of the resistance of the test line on the test results. It can be able to increases the current to 10A by which can test extremely low resistance to 0.01 Ω(such as amorphous alloy, Copper-nickel, nickel-chromium-iron, iron-chromium-aluminum etc). For the tested objects with high resistance value (CT/PT), the instrument can extend the range to 20 kΩ,so the wide resistance test range enables KRI9310 can cover 80% of the power transformer products on the market and switchgear bus-bar cable etc. The power of the tester use the built-in rechargeable lithium battery that can test hundreds of transformers by one time charging.

  • Surface & Volume Resistivity Meter for Nonconductive Materials

    Hiresta UX - OAI

    The new Hiresta-UX is a high performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials. With an extended measurement range of 103 ~ 1014Ω, this meter is ideal for Production, Engineering, R&D and Quality Control. The new Hiresta-UX features powerful new algorithms that automatically choose the right voltage, which optimizes the surface and volume resistivity testing. This versatile, high performance resistivity meter includes a built-in switch box that can be mated with a J-Box (meets JIS K 6911 for surface & volume resistivity and is compatible with ASTM D 257) as an option. The Hiresta-UX can store up to 2,000 measurement results, which can be easily exported to a USB memory device.

  • 300-Watt AC/DC Power Supply, 6U VME

    Model 56SQ2 - North Atlantic Industries

    NAI’s 56SQ2 is a 300 Watt AC/DC Power Supply that uses two slots in a standard VME chassis. It is conduction-cooled through the card edge/wedgelock. This power supply accepts either a single- or three-phase input and provides up to 5 standard VME outputs plus standby at 300 Watts. It is designed for VME and general purpose applications. An onboard microcontroller allows for design flexibility.Standard features include continuous Background Built-in-Test (BIT); remote error sensing; holdup time; and protection against transients, overvoltage and short circuits. Options such as power fail warning, vibration testing, over-temperature monitoring and shutdown, current share, and extensive signaling (including ANSI/VITA) are available.

  • Earth Resistance Soil Resistivity Tester 2 / 3 / 4 Wire

    Model KM 1320 - Kusam Electrical Industries Limited

    KM 1320 Earth Resistance Soil Resistivity Tester is specially designed and manufactured for measuring earth resistance, soil resistivity, earth voltage, AC voltage. Adopting the latest digital and micro-processing technology, precise 4-pole, 3-pole and simple 2-pole method for earth resistance measurement, importing FFT and AFC technology, with a unique function of anti-interference capability and the ability to adapt to the environment, consistency of repeat testing, to ensure high precision, high stability and reliability for prolonged measure, which is widely used in electric power, telecommunications, meteorology, oil field, construction, lightning protection, industrial electrical equipment and other earth resistance, soil resistivity, earth voltage, AC voltage measurement.

  • SPD High, Medium, and Low Voltage TOV Test Equipment

    Shanghai Guantu Technology Co., Ltd.

    The high (medium) voltage TOV tester is used for transient overvoltage tests caused by faults in high and medium voltage systems such as surge protectors (SPDs), and can also be used for other scientific research tests.standardGB/T 16927-1997 High voltage test technology.GB18802.1-2011 Surge protective device (SPD) for low-voltage power distribution system Part: Performance requirements and test methods.IEC61643-1:2005 (Surge protective devices connected to low-voltage power distribution systems part 1: Performance requirements and testing methods)TOV fault test equipment1. Three-phase isolation test transformer2. Single-phase test transformer3. Low voltage switchgear4. Power controller5. Test voltage and current measurement6. Sample box

  • LED Burn-In Test

    LXinstruments GmbH

    Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.

  • Dynamic IR Scene Projectors

    Mirage™ - Santa Barbara Infrared, Inc.

    In 1999, SBIR introduced MIRAGE™, the world’s first integrated Dynamic IR Scene Projection System, designed to support hardware-in-the-loop testing of missile seekers, FLIRs, counter measure simulation and tracking systems. MIRAGE™ is a complete turnkey infrared scene projector that utilizes unique resistive emitter array technology to produce high definition dynamic IR scenes. The original MIRAGE™-1 used a 512 x 511 pixel resistive array emitter capable of frame rates up to 200 Hz. Below is a list outlining the progression of the product line and a list of SBIR’s currently available scene generation systems:

  • Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card

    GX5296 - Terotest Systems Ltd.

    The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).

  • Simulation Systems

    Bloomy Controls, Inc.

    Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.

  • PXI-7841, Virtex-5 LX30 FPGA, 200 kS/s PXI Multifunction Reconfigurable I/O Module

    780337-01 - NI

    Virtex-5 LX30 FPGA, 200 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7841 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7841 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.

  • PXI-7953, Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module

    780340-01 - NI

    Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7852 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7852 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.

  • sbRIO-9218, Non-Enclosed, 24-Bit, 51.2 kS/s/channel, 2-Channel C Series Universal Analog Input Module

    783362-02 - NI

    Non-Enclosed, 24-Bit, 51.2 kS/s/channel, 2-Channel C Series Universal Analog Input Module - The sbRIO‑9218 helps you perform multipurpose testing. With the sbRIO‑9218, you can measure signals from sensors such as strain gages, resistance temperature detectors (RTDs), thermocouples, load cells, and other powered sensors. You also can use the sbRIO‑9218 to perform quarter-bridge, half-bridge, and full-bridge current measurements, with built-in voltage and current excitation. You can individually select and perform a different measurement type on each channel. Additionally, the sbRIO‑9218 features 60 VDC analog input isolation. Non-enclosed modules are designed for OEM applications.

  • PXI-7853, Virtex-5 LX85 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module

    780341-01 - NI

    Virtex-5 LX85 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7853 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7853 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.

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