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Contact Resistance Test Sets
When a high current passes through a pair of mechanically independent metallic contacts, the resistance must be as low as possible. An increase in resistance can lead to additional degradation, as I2R losses will cause local heating of the contact surfaces. Our range of micro-ohmmeters measure both steady state and dynamic low resistance values. With test currents up to 600A available, logging and trending are also available on some models. We ensure that our Contact Resistance tests sets are portable, making them suitable for field measurements. Our contact resistance testers’ portability makes them ideal for a vast range of resistance testing across the entire LV, MV HV and EHV spectrum.
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PXIe-6368, 16 AI (16-Bit, 2 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module
781058-01
PXIe, 16 AI (16-Bit, 2 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6368 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6368 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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9025 VXI - 25 Module Solution for VXI
The 9025 VXI Receiver is a 25-module solution designed for use with VPC pre-wired interconnect adapters, but can also accommodate a combination of pre-wired interconnect adapters and discrete-wired modules using retainer blocks.1-4 modules attach to an interconnect adapter which in turn is attached to the VXI card. This connector “funnel” forms a complete VXI module, which is easily inserted or removed from the VXI mainframe for maximum flexibility in testing applications. The interconnect adapter also provides room for driver sensors. External cabling to the card is done with a cable clamp or connector located on the top or bottom of the adapter. The positioning of funnels and use of discrete wiring modules can affect the performance of the product. Please contact us for technical assistance.
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Quality Of Service
Traffic is prioritized according to its importance and some types of traffic are more sensitive to latency, jitter and packet loss than other. Xena offers QoS validation solutions in accordance with RFC 2544 and Y.1564, as well as advanced statistics functions that help users track, analyze and troubleshoot QoS to maintain a high service quality guarantee. Testing that link performance complies with a Service Level Agreement (SLA) includes verifying Frame Transfer Delay (FTD), Frame Delay Variation (FDV) and Frame Loss Ratio (FLR) at the Committed Information Rate (CIR) defined in the SLA. Verifying the SLA with the Xena1564 allows doing the test on a line simultaneously loaded with traffic from other services.
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Network Tester
ZhangZhou Weihua Electronic co.,ltd
There is nothing worse than running your drops only to learn that you have a fault in one of the cable runs. Get it right the first time, get it right by choosing and using the right LAN Cable Testers. We offer a variety of cable testers, which are a must have to quickly and easily verify the integrity of Ethernet twisted pair cables. Our LAN testers will test twisted pair cables for open pairs, shorted pairs, reversed pairs, crossed pairs and split pairs. Network cable testers vary in complexity and price, but a basic tester consists of a source of electrical current and a measuring device. After that, cable testers vary in complexity and ability to do various testing.
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Network Test Solution
CyPerf
Realism: Create digital twin of users, applications, and attacks to replicate and test QoE in real-world network environments.Native authentication: Send application and security traffic over authenticated sessions at high scale.Highly scalable: Supports millions of concurrent users and millions of connections per second that elastically scale up and down, enabling both resiliency and chaos testing.Containerized agents: Deploy lightweight traffic agents as containerized pods on-prem, VMs, managed Kubernetes deployments, private or public cloud (AWS, GCP, Azure)Lab and live network testing: Test performance and security both pre-deployment in a lab or safely in live production networks.Flexible: Portable subscription-based software solution with a robust and intuitive cloud-native GUI management dashboard
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Stand-alone Software
N4391AU
The analysis software from the N4391A optical modulation analyzer can be used on your PC without any instrumentation. It offers all the analysis capabilities of the N4391A including its advanced signal processing algorithms for complex modulated optical signals. Use this software to process and analyze raw data stored as .sdf, .mat or .csv files from N4391A or N4392A measurements. This capability allows you to work with the data as if you would work directly in front of the instrument. It is an excellent tool for developing your own signal processing algorithms and testing them off-line, together with your MATLAB compiler. In addition, this software is an effective tool for learning basic and advanced concepts of complex optical modulation, based on stored files.
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Memory Analysis Software for Logic Analyzers
B4661A
DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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Haze Meter
DRKWGT-2S
Shandong Drick Instruments Co., Ltd.
DRKWGT2S transmittance / haze analyzer is a computerized automatic measuring instrument which is designed based on the People's Republic of China national standard GB241080 "transparent plastic light transmittance and haze test methods" and the American Society for testing and materials standard ASTM D100361 (1997) Standard Test Method for Haze and Luminous Transmittance of Transparent Plastice." It could apply to all transparent, translucent parallel plane sampler (plastic plates, sheets, plastic film,sheet glass) of light transmittance, transmission haze and reflectivity test also applies to liquid samples (water, beverage, pharmaceutical, colored liquid, grease) turbidity measurements in defense research and production workers and peasants to have a wide range of applications.
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FLASH Memory Endurance Cycling Systems
NTS3700 Series
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
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Solar Array Simulator
Among other things, solar array simulators are required for testing satellite power supplies. An SAS (Solar Array Simulator), consisting of an interconnection of several Solar Array Simulator modules, maps the solar panels and displays the individual strings connected in parallel. Optionally, the individual SAS modules are monitored by a Second Level Protection, so that the test object is not damaged in case of errors with the voltage sources. Additional circuitry is implemented via project-specific test modules. The signal path to the DUT can be separated, e.g. for dynamic current measurements.The Keysight Solar Array Simulators used were specially developed for satellite applications and cover the significantly higher requirements regarding the control speed of MPP tracking compared to terrestrial applications.
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Phoenix Modular Facilities
The lean design and unparalleled portability of Atec’s Phoenix™ Series Modular Test Cells have shifted the paradigm for engine testing. The Phoenix Cell delivers the functionality of traditional brick and mortar engine test cells with the added benefit of efficiently transported equipment. It offers our customers a flexible, low-risk, value-driven engine test cell solution for their most important equipment. The Phoenix Modular Cell is the premium solution for turboshaft, APU, and test bench applications. It can be particularly attractive where construction in certain settings may be difficult, or where usages may be short term or temporary at the location. No matter the logistics, Atec has a Phoenix™ Series Modular Enclosure to meet your needs.
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Battery Fault Insertion Unit
The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing. Additionally, a four-wire auxiliary input allows you to connect an external digital multimeter (DMM) instrument to any cell channel for very high-accuracy bypass current and cell voltage measurements. Each FIU provides 24 independently-programmable cell-switching channels for one or two 12-cell Battery Simulator 1200 units. Additional Battery Simulator 1200 and FIU instruments can extend functionality up to 120 series-connected cell channels.
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PXIe-6376, 8 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module
781475-01
PXIe, 8 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6376 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6376 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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PXIe-6358, 16 AI (16-Bit, 1.25 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module
781054-01
PXIe, 16 AI (16-Bit, 1.25 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6358 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6358 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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PXIe-6366, 8 AI (16-Bit, 2 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module
781057-01
PXIe, 8 AI (16-Bit, 2 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe‑6366 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6366 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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PXIe-6356, 8 AI (16-Bit, 1.25 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module
781053-01
PXIe, 8 AI (16-Bit, 1.25 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6356 is a simultaneous-sampling, multifunction data acquisition device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6356 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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PXIe-6378, 16 AI (16-Bit, 3.5 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module
781476-01
PXIe, 16 AI (16-Bit, 3.5 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6378 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6378 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Biconic Logarithmic Periodic Antennas
Stacked LPDA
The stacked Logarithmic Periodic Dipole Antenna consists of two ordinary Log.-Per. structures. The excellent characteristics (flat gain over a large bandwidth, low SWR) of the ordinary Log.-Per. designs could be maintained using the stacked LP design. The stacked design helps to focus the directional pattern of the H-plane somewhat, resulting in a typical gain improvement of ca. 2-3 dB compared to an ordinary LPDA. This is especially important for immunity testing, where a maximum fieldstrength and a good field uniformity is required. The beamwidth in the E-plane and the H-plane are nearly identical, providing an optimised illumination of the EuT with minimised ground reflection influence. Further the STLP 9128 C has an excellent cross-polar rejection.
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Endevco Cryogenic Charge Output Accelerometers
PCB's acquisition of Endevco's full line of testing sensors means all Endevco sensors are now backed by PCB's Total Customer Satisfaction (TCS) guarantee. Endevco® cryogenic piezoelectric accelerometers are built specifically for measuring vibration under cryogenic conditions down to -452° F (-269° C). Signal outputs of these units are very stable even at extremely low temperatures. Their rugged internal construction is designed to withstand multiple cycles of thermal shock with steep temperature gradient. The accelerometers are self-generating devices that require no external power source for operation and contain no electronics. This allows them to operate below the -320° F (-196° C) limit of ICP accelerometers, down to -452° F (-269° C).
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FaithTech Ultra Low Voltage And High Current DC Load
NZ/N Series
Shenzhen FaithTech Technology Co., Ltd.
Ultra low voltage and high current DC electronic load is a high reliability and high performance electronic load product derived from FT conventional electronic load for low voltage and high current test scenarios such as fuel cell test and CPU power supply device test. For different current levels, this product includes two series: NZ and N. The voltage is 0-20V or 40V, in which the NZ series can be loaded with 0V full current, and the N series can be loaded with ultra-low voltage and full current. The load capacity is up to 0V@1200A and 0.2V@5000A . This series of products has high precision and high cost performance, which is your good choice for testing.
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Microwave Cables Assemblies
Panda Microwave specialize in the production of high performance microwave cable assemblies. We have a strong R&D team and advanced production and testing equipment. We have several automatic wire stripping machine from Switzerland, laser wire stripping machine, keysight vector network analyzer, CNC wire bending machines. Our cable assemblies have high performance, high quality, wide variety, superior performance, frequency coverage of DC~110GHz, widely used in radar, aerospace and other military and civil fields. Our price is highly competitive, and we set up long term relationship with more than 100 military institutes customers.
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USB DAQ
ADLINK USB DAQ modules leverage the expertise of ADLINK's analog design capability, enhancing convenience of data acquisition. Simply plug the ADLINK USB DAQ into a USB port on your computer or notebook for performance equaling or even exceeding that of ADLINK PCI/PCIe DAQ cards, with no need to power down or open the chassis. As well as providing basic voltage measurement, ADLINK USB DAQ modules feature built-in signal conditioning to directly receive measurement from most commonly used sensors, with no need for extra signal processing. From basic testing to high-accuracy measurement, from portable application to industrial automation, the ADLINK USB DAQ series delivers easy, efficient, and accurate measurement every time.
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Air Data Test Set
ADTS-2000
TestVonics ADTS-2000 Test Set is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The ADTS-2000 meets all requirements of the KTS-2000 , P/N: 18910920000, P/N: 18910920001, P/N: 18910920002, or having NSN: 4920-01-588-4428 and NSN: 4920-01-554-4549 . The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-2000 accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.
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Advanced Test Platform
980 12G
The Teledyne LeCroy quantumdata 980 12G-SDI Video Generator / Analyzer module supports video and audio functional testing of next gen broadcast monitors, conversion devices and sources up to 12G-SDI. The module is equipped with four (4)12G-SDI-capable output ports. The output ports can be aggregated for Dual link HD-SDI and Quad link 3G-SDI operation. A genlock input supporting both SD analog black burst and HD tri-level to sync the output clocks with a "house sync" but the module can also run off its internal clock. The module's four (4) SDI input ports can also be aggregated for Dual link HD-SDI and Quad link 3G-SDI operation. For single link operation only port 1 on the input or output is functional.
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Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Advanced Primary Injection Test Set
PI-2500
The PI-2500 is a versatile and technologically advanced primary injection tester capable of testing circuit breakers up to 2000 amperes frame size. It incorporates a low-impedance output transformer with dual secondaries to provide optimal impedance matching to a wide range of breaker sizes. High-capacity internal fan cooling allows maximum utilization of the output transformer and faster recovery after overload conditions. It is housed in a rugged aluminum frame enclosure with removable sides allowing easy access to all internal components to facilitate ease of service and maintenance. The output of the test set is controlled by means of a proven SCR controller. This provides precise initial phase angle control to reduce DC offset for inductive loads and more consistent pulse currents.
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Electric Vehicle Test Solution
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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Ceramics and Glass Inspection Systems
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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DC Vibration Unit Tester
BK2116
As the technology for BLDC motors advances, more advanced testing is also needed. The BK2116 DC Vibration Motor Tester was designed when of several of our clients needed to test the new generation of 3 port DC vibration motors. Using the BK2116, you can test the electrical specifications (RPM, current, drop pulse, and start up voltage) and also vibration level, and noise of motors with either 2 or 3 ports. The BK2116 can concurrently test 2 DUT's and BaKo's Test Shop software makes it very easy to set up and test. And because you use it with a PC or notebook, you can see graphs of the data as you test, and also save it to analyze later, or to analyze the data you gather over time.
