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Showing results: 8371 - 8385 of 8512 items found.

  • High Voltage 50 Ω Pulse Generator

    TLP-4010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components

  • PXI 36 Channel Data Comms MUX, 96-pin SCSI

    40-735-912 - Pickering Interfaces Ltd.

    The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.

  • PXI 18 Channel Data Comms MUX, 96-pin SCSI

    40-735-902 - Pickering Interfaces Ltd.

    The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.

  • Fibre Channel

    Teledyne LeCroy

    Fibre Channel continues to evolve as the preferred communications standard for mission critical and time sensitive Storage Area Network (SAN) applications. Fibre Channel supplies over 80% of the datacenter and enterprise interconnections where lossless delivery of data is required and will be used for many years to come. Gen 6 (32GFC) products and solutions are rapidly being deployed ubiquitously across key markets today.The Fibre Channel industry is now focusing efforts on the development of Gen 7 – 64GFC utilizing PAM4 signaling – and will continue to serve those applications needing higher bandwidth and guaranteed delivery of time and content sensitive data.The SierraNet Family of Fibre Channel test platforms provides best in class traffic capture, analysis, and manipulation for testing physical link characteristics and application operations. SierraNet is designed for addressing today’s high-speed storage and communications fabrics problems and compliments other tools offering industry leading visibility and utility.

  • PCI Express Waveform Digitizer: 12-Bit A/D, 200 MS/s, 4-CH, 125 MHz BW, 8-16 GB Memory

    Razor Express 12 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • Interface Module for the Multimode, Multiprotocol Excalibur 400 Family of Carrier Boards

    M4K1553Px(S) - Excalibur Systems, Inc.

    The M4K1553Px(S) interface module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards provide a complete solution for developing and testing 1553 interfaces and performing system simulation of the MIL-STD-1553 bus. The module handles all standard variations of the MIL-STD-1553 protocol.Each M4K1553Px multi function module contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped, and may be accessed in real time. Each of the independent dual redundant M4K1553Px modules may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT, and Bus Monitor. In addition, modules 1 and 3 can be programmed to operate as Concurrent monitors, to modules 0 and 2 respectively.Each M4K1553PxS single function (RT validated) module operates either as a Bus Controller, Remote Terminal, or Bus Monitor.

  • PCI Express Waveform Digitizer: 16-Bit A/D, 100 MS/s, 4-CH, 65 MHz BW, 4-16 GB Memory

    Oscar Express 16 CompuScope - PCIe - GaGe

    Available in 4-CH and 2-CH models featuring 16 software selectable A/D sampling rates from minimum 1 kS/s to maximum 100 MS/s per channel with input bandwidth of 65 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 800 MB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.

  • 8-CH 14-bit 100 MS/s High-Speed PXI Express Digitizer

    PXIe-9848 - ADLINK Technology Inc.

    The ADLINK PXIe-9848/9848H is an 8-channel, 14-bit, 100 MS/s digitizer delivering both high-accuracy measurement results and high-dynamic performance. With a PXI Express bus interface and ample onboard acquisition memory up to 512 MB, the PXIe-9848/9848H can easily manage simultaneous 8-CH data streaming. High density and high speed digitizer features ideally position the PXIe-9848/9848H for applications such as LIDAR, radar signal acquisition, and PSU (Power Supply Unit) testing applications.The PXIe-9848 provides a flexible set of input ranges from ±0.2V to ±2V, software selectable 50Ω or 1MΩ input impedance, a wide variety of triggering options and tight synchronization capability, all maximizing convenience of use. In addition, ADLINK provides the PXIe-9848H, features a x15/x50 signal condition module providing both high input voltage range of ±100V and high dynamic performance, delivering the optimum solution to measurement range expansion in a PXI system.

  • Tri-Temp Test Handler

    SIA-118 Series - SESSCO Technologies, Inc.

    Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB contactors for SOIC, QSOP, SSOP, QFN, TO, MEMS and other custom packages. It is ideally suited for Engineering, Qualification Lot, and small-to-medium production run with easy migration to full production capability. This is a popular model for custom applications with very low NRE. Powered by a cutting-edge 80 ns/step all integrated controller and modular programming design for easy customization.

  • Tactical Grade Inertial Measurement Unit (IMU)

    ADIS16490 iSensor - Analog Devices Inc.

    The ADIS16490 iSensor® device is a complete inertial system that includes a triaxial gyroscope and a triaxial accelerometer. Each inertial sensor in the ADIS16490 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements. The ADIS16490 provides a simple, cost-effective method for integrating accurate, multiaxis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. The SPI and register structure provide a simple interface for data collection and configuration control.

  • Wire Harness Tester

    Panther4HT Master- Slave DSU - Qmax Test Technologies Pvt. Ltd.

    The Master- Slave DSU based Panther4HT Wire Harness tester is designed for testing and verifying electrical connections in a cable, harness, backplane or any other wired assembly. It offers unique Qmax MASTER - Slave concept and SATELLITE UNIT Options to avoid looping back of cable to the ATE. All Satellite Units communicates the measurements through LAN interface which is very useful for on-board applications in Aircrafts / Ships and similar applications where large cable looms are used. This innovative concept will eliminate the long adapter cables and hence storing, maintaining and re work of these kind of cables are avoided. Furthermore single Master Controller Unit (MCU) is used to control not only all the satellite units , but also communicate with all satellite units through Ethernet Communication port. A single reference Cable is used to link the all the satellite units with the Master Controller in controlled loop manner is a value add to the product.

  • High Speed Device & Flash Programmer

    JT 2147 QuadPOD - JTAG Technologies Inc.

    The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).

  • Leeb Hardness Tester

    THL210 - TMTeck Manufacturing Limited

    LCD display of 128×64 matrix with back-light, showing all functions and parameters. Converts to all common hardness scales (HV,HB,HRC,HRB,HRA,HS). English displaying and easy and convenient menu operation. Powerful PC Software available and USB 1.0 interface and USB with Protective Membrane. 7 types of Impact Device optional, which don't need to be recalibrated when changing them. Memory of 600 groups data(impact times:32~1). Lower limit setting and sound alarm. Material of “cast steel” is added; HB values can be read out directly when D/DC impact device is used to measure “cast steel” work piece. Printer be separated from main unit and copies of testing results can be printed as required. Normal battery AAA and big power store while USB connected and charging controlling circuit. Inbuilt function of Software Calibration.

  • Fused Test Probes with Silicone Test Leads

    AL-57FL - Standard Electric Works Co., Ltd

    ● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A

  • Continuity of Insulation Tester (High Voltage Method)

    ZGQ-16B - Shanghai Dean Electrical Co., Ltd

    Executive standard: GB/T4074.5-2008/IEC60851-5;Inspection standard: JB/T4279.13-2008Meet GB/T6109-2008 standard requirementsUsed to test the Insulation continuity (namely the pinhole number of enameled wire sample per unit length) of enameled round wires with nominal conductor diameter ranging from0.05mmto1.60mm;8 level test voltages can be selected by pressing button: 350V, 500V, 750V, 1000V, 1500V, 2000V, 2500V and 3000V;Test length ranging 0~99m;Application of SCM control.Automatically complete test process, display wire testing length and pinhole number;Brushless driving motor, guide pulley and take up pulley are equipotent.The electrode insulation to ground, using high resistance material of non-hygroscopic, no leakage, no tracking, easy to clean, Insulation thickness can ensure long-term 3000V voltage effect.Circuit board is subject to anti-static and moistureproof and long-time aging treatment, has more stable quality and higher durability;

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