Showing results: 166 - 180 of 332 items found.
-
ES-38 -
Electro Scan Inc.
The ES-38 is designed for scanning laterals from 3 to 8 inches in diameter. Using Electro Scan's proprietary technology, variations of electricity flowing through the pipe wall, associated with distance measurements, are automatically transmitted to Electro Scan's Smartphone application to record and display defect locations and their relative size.
-
Dewesoft d.o.o.
Static and Dynamic Balancing of Rotating MachinesBalanced rotors are essential for the smooth operation of rotating machinery. Unbalance will create high vibrations, reducing machine life and causing material defects. Our single and dual-plane balancing tool is a great tool to eliminate unbalance on-site reducing long down times.
-
Dragonfly -
Onto Innovation
Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
-
7201 -
Chroma ATE Inc.
The Chroma 7201 was designed to measure wafer lengths, widths, diagonal, orthogonal and chamfer size and angle, it is also capable to detect surface stains. User friendly software and GUI enable versatile parameter setting and result, it also provides a defect display and storage function for further analysis or potential MES/CIM integration.
-
Tandex Test Labs, Inc.
Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
-
Chroma ATE Inc.
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
-
Mistras Group, Inc.
Our lab services use advanced techniques to thoroughly inspect components for manufacturing flaws before assembly. We work with clients in the aerospace, automotive, oil & gas, manufacturing, wind energy, and various other industries to ensure their materials and components are free from defects that were introduced in forging or manufacturing processes.
-
PADD -
Amperis sl
We developed the PADD for the detection of internal and external partial discharges on metal oxide lightning rods. Defects can cause radio interference in communication systems or TV images, interference whose origin is very difficult to locate. We have developed a unique technology for detecting radio frequencies for use under voltage.
-
KLA-Tencor Corp
KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
-
Pickering Interfaces Ltd.
All of our fault insertion matrices feature a breakout arrangement that allows faults to be attached to the sensor lines via the Y axis. This includes the breaking of a connection or the adding of a series defect – all of which can simulate connectivity problems in the system. The three pin breakout versions allow the connection to be swapped for a “bad” sensor simulation.
-
Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator.
-
eloZ1 -
TOPTEST GmbH
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
-
Angara -
ViTec Co. Ltd
The machine vision system ASKKM "Angara" is designed to detect and reject defects in the marking of labels, excise stamps, boxes, vials, ampoules, bottles, etc., which have visual manifestations in the field of permanent or variable printing. It is installed on a conveyor or mounted in a labeling machine. Labels are checked before being applied to the product or marking on the package.
-
Green Hill Software, Inc.
Static analyzers attempt to find code sequences that may result in buffer overflows, resource leaks, or many other security and reliability problems. Source code analyzers are effective at locating a significant class of defects that are not detected by compilers during standard builds and often go undetected during run-time testing or typical field operation.
-
Quadra 3 -
Nordson Corporation
Quadra™ 3 is your partner for high quality X-ray inspection for production line quality control. Detect a wide range of manufacturing defects including BGA, QFN and IGBT attachment, PTH filling, interfacial voiding, component cracking and counterfeit device screening. High quality, high magnification inspection for product applications.