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other than specified, imperfection .


Showing results: 241 - 255 of 330 items found.

  • Dinger™

    Signalysis, Inc.

    The Dinger is a fast yet sensitive NDT (non-destructive test) system used for batch or 100% inspection of raw or machined metal cast, fabricated, sintered, forged, die cast, or ceramic parts. It’s built on our IQC foundation that’s in daily production use by customers worldwide, and has tested over a million parts. Dinger allows you to dramatically improve the shipped quality, by quickly and reliably identifying parts with either global or local manufacturing defects.

  • 3D Sensors (Main Screen)

    surfaceCONTROL - Micro-Epsilon Group

    surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.

  • Static Analysis

    SAST - Synopsys, Inc.

    Coverity® is a fast, accurate, and highly scalable static analysis (SAST) solution that helps development and security teams address security and quality defects early in the software development life cycle (SDLC), track and manage risks across the application portfolio, and ensure compliance with security and coding standards.

  • Ceramics and Glass Inspection Systems

    Intego GmbH

    Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.

  • Reliability Testing

    ELES Semiconductor Equipment SpA

    ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests,  or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes  and during lifetime (often these defects escape ATE).  The improvements to products and processes needed to arrive at zero defects  cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.

  • Automated Testing System

    PV-LIT - InfraTec GmbH

    Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects

  • Fibolocator

    Fibotec Fiberoptics GmbH

    Fibolocator is an innovative device for measuring and characterizing fractures and other defects in optical fibers that cause backscatter. Time-resolved correlation reflectometry is the principle on which the device is built. OTDR cw laser diodes are used. The test signal requirements and the complexity of the system are low, resulting in very low cost OEM subsystems.

  • Variable Frequency High-Current Multifunctional Ground Impedance Test System

    SFJ044 - Shanghai Launch Electric Co., Ltd.

    The system complies with DL/T621-1997 standards of Grounding of AC Electrical Equipment , used to test grounding system, connected resistance and soil resistivity of large power plants and substations. It makes up for the defect of traditional measuring approaches, offering complete test items and reliable test for large grounding system

  • PXI Fault Insertion / Signal Insertion Switch Modules

    Pickering Interfaces Ltd.

    Pickering's PXI Fault Insertion / Signal Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect all of which can simulate connectivity problems in the system. Two switching topologies are available: *Single signal paths with series switches and switches to connect to one or more fault buses*Pairs of signals with series switches, shorting switches between the signal pairs and switches to connect either signal to an external fault input.

  • MPI Sorter Series

    MPI Photonics Automation

    MPI’s Sorter Series are improving production efficiency and yields for market sectors related to LED chip, package production, discrete device handling, and IC substrate manufacturing. Deploying MPI’s Pick & Place technology, the Sorter Line offers dedicated sorting and defect inspection solutions particularly suited for GaN, GaAs, Vertical LED Chip, Flip Chip, and Laser Diode applications. With a proven heritage of and market-advanced technologies, MPI offers competitive and differentiated solutions that are scalable and cost-effective.

  • Circuit Breaker Time Interval Meter

    Crest Test Systems Pvt. Ltd.

    Measuring contact timings is useful for finding the contact bounces and non-simultaneity of contacts. This helps in finding the possible electrical or mechanical defects in the circuit breaker contacts. Timing analysis also make it possible to detect incorrect mechanical adjustments and wear phenomena of the circuit breaker by measuring the differences between the fastest and slowest phases.

  • PD Surveyor with RFI & EMI Diagnostics

    PDS200 - Doble Engineering

    The Doble PDS200 is a combination survey tool that uses radio frequency interference and electromagnetic interference diagnostics to find signs of partial discharge.This hand-held instrument is an ideal tool for a condition based maintenance program, allowing you to quickly find insulation defects in motors, generators, transformers, cable terminations and additional substation components.

  • kSA Emissometer

    k-Space Associates, Inc.

    The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers.  Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.

  • Panaya Release Dynamix

    Release Dynamix - Panaya, Ltd.

    Panaya Release Dynamix (RDx) enables organizations to drive innovations by enabling the continuous delivery of business-driven changes with speed and simplicity. Traceability – Users can map tests and defects to business change request and development requirements, increasing quality and business assurance. Agility – Change delivery managers can enable continuous delivery through visibility into requirements, user stories and tasks. Compliance - Organizations can employ a requirement approval workflow to comply with internal as well as regulated change introduction processes while continually managing the change lifecycle process.

  • Automated Optical Inspection (AOI)

    TR7700 SIII - Test Research, Inc.

    TR7700 SIII is the newest generation of TRI's AOI solutions, delivering precise multi-phase inspection at full speed. By combining an ultra-fast camera, intelligent auto conveyor, and new GUI, the TR7700 SIII offers a powerful and easy to use AOI solution with fast programming, optimized board loading, production line integration and support for offline programming. TRI's new color algorithm combined with multiple lighting phases increase defect coverage and help deliver highly accurate inspection results with a minimum of false calls.

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