Showing results: 1 - 15 of 35 items found.
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KLA-Tencor Corp
The FilmetricsĀ® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
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30C9 -
Delcom Instruments Inc.
For thick conductive materials or conductive coatings on a thick substrate. The 30C9 sensor has a 30 cm reach and 9 mm gap.
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Delcom Instruments Inc.
Non-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreMeasures nearly all thin conductive materials or coatingsChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterFor benchtop or inline applicationsSimple one-button operationSmall footprint with detached sensor probeOptions include vacuum-ready probe, PC-based productivity software, Ethernet connectivity, stage, and more
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VLSI Standards, Inc.
Indium Tin Oxide Sheet Resistance Standards (ITOSRS) from VLSI Standards are NIST-traceable products, intended for calibration of both contact and non-contact sheet resistance measurement tools used in the LCD, flat panel and touch-screen markets.
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Electrical Char -
Frontier Semiconductor, Inc,
Full line of front end electrical characterization tools: Sheet Resistance, leakage, and CV-IV measurements.
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EC-80 -
NAPSON Corp.
*Easy operation and compact design*Auto-measurement start by inserting a wafer under the probe*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range
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CRN-100 -
NAPSON Corp.
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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NC-80MAP -
NAPSON Corp.
*Possible to measure wide range of sheet resistance by installing Max. 4 probes*Min. 7 mm position from edge can be measured*User programable measurement pattern & programmable measuring pattern
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NC-600 -
NAPSON Corp.
*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
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PVE-80 -
NAPSON Corp.
*No damage measurement by non-contact Pulse-Voltage excitation method*Easy to measure & carry around, Removable stage plate*Easy operation and data processing by PC with Software*Measurement result can shown by 3 types of measurement unit (Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])*Pulse-Voltage excitation method : Pat. No.5386394 Joint development with Chiba Univ.
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NC-700 -
NAPSON Corp.
*Inline measurement module for moving substrates such as PET film, glass or paper*Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system*Various applications from the research and development to the production line
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NC-60F/RS-1300N -
NAPSON Corp.
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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WS-3000 -
NAPSON Corp.
*Automatic probe head selection(exchanger) among 4 kinds of probe head*[No need to exchange a probe head by each different sample measurement]*Edge 1mm measurement is available by dual meas. mode*High cost performance from high speed measurement*FOUP compatible, GEM / SECS compatible
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RT-3000/RG-1000F -
NAPSON Corp.
*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
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DUORES -
NAPSON Corp.
Easy to measure sheet resistance & carry aroundReplaceable hand-held probes for Non-destructive & Contact type