Showing results: 16 - 30 of 35 items found.
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M200 -
CAPRES A/S
The window of acceptable sheet resistance is shrinking with each technology node resulting in increasingly more rigorous standards for scale and accuracy of metrology tools. The shortcomings of traditional types of 4 point probes are becoming more and more evident. By developing the microRSP-M200, a unique tool for measuring the sheet resistance of conducting films, hereunder ultra shallow junctions (USJ’s), CAPRES A/S has responded to the growing need for reliable sheet resistance measurements on micro scale.
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MX 60x -
E+H Metrology GmbH
The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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DRK136B -
Shandong Drick Instruments Co., Ltd.
DRK136B Film Impact Tester is applicable in the precise impact resistance test of plastic films, sheets, laminated films, rubber and other nonmetal material.
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DRK136A -
Shandong Drick Instruments Co., Ltd.
DRK136A Film Impact Tester is applicable in the precise impact resistance test of plastic films, sheets, laminated films, rubber and other nonmetal material.
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SKZ148 -
SKZ Industrial Co., Ltd
Dart impact testing machine used for plastic films and sheets of impact test to evaluate the impact resistance, it adopts background light source for test results.
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HS-MPRT-5 -
HenergySolar
t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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Qualitest International Inc.
Qualitest offers a Drop Dart Impact Tester which is simple to use as a stand-alone, non-instrumented tester. It is used to measure impact resistance of film, sheet, and laminated materials.
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Benz Co., Inc.
For impact resistance testing of plastic film, sheet, and laminated materials, a specific weight is dropped from a specific height onto a firmly held sample to determine a 50% failure rate.
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NC-110 (NC-110PV) -
NAPSON Corp.
*Possible to measure sheet resistance without contact by Max. 3 types of probes*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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EC-80P (Portable) -
NAPSON Corp.
*Auto-measurement start by probe head contacting to sample*3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range*Resistivity probe can be changed by sample’s resistivity range
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Signatone Corp.
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Sataton Instruments Technology CO., Ltd
DIN abrasion tester basing on the rotating cylindrical drum is to determine the volume loss and abrasion resistance index due to the abrasion action of rubbing a specimen over a specified abrasive. It is the recommended testing machine to evaluate for abrasion resistance of rubber, vulcanized or thermoplastic materials. The tester includes a laterally movable specimen holder and a rotatable cylinder with abrasive sheet fixed can provide two testing methods, non-rotatable specimen test and rotating test piece.
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Elcometer Limited
When assessing a coating for suitability for a particular application the testing of the physical properties such as bendability, impact resistance, hardness, washability and abrasion resistance are all required to provide information for decision making. Testing of the pigments using fineness of grind gauges, determining the specific gravity of the coating using density cups, measuring the viscosity using viscosity cups or rotational viscometers and assessing the drying time all provide information for the coating technical data sheets.
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M300 -
CAPRES A/S
The semi-automatic microRSP-M300 by CAPRES A/S is a unique R&D tool for sheet resistance measurements of conductive surfaces in micro scale. Like the automatic microRSP by CAPRES A/S the semi-automatic microRSP makes use of the micro 4 point probe characterised by having a probe pitch of 1000 times smaller pin spacing/pitch than that of conventional probes.
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Four Dimensions, Inc.
Our four point probes measure the sheet resistance / resistivity / thickness of a wide variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks. We offer a wide range of models, options, and probe heads to suit your materials', measurement, and budget needs.