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Showing results: 2461 - 2475 of 3170 items found.

  • PCI Data Acquisition Boards

    Ultraview Corporation

    Ultraview''s PCI data acquisition add-in cards are complete data acquisition (A/D) and control (D/A) systems on a single PCI Bus card. Ranging in speed from dual 14 and 12-bit 1-25MSPS boards up to 1500MSPS 8-bit boards with 8GB/16GB of on-board RAM. All cards come with graphical waveform viewers, example user programs (source code included) and device drivers for Linux or Solaris, allowing users to quickly prototype and develop their applications.

  • Non-Contact High-Precision Proximity Measuring System

    KD-2446 - Kaman Fuzing & Precision Products

    * Outstanding precision: static resolution to 12 microinches* Excellent performance with ferrous targets* Variable voltage input from 12 to 24 volts DC* Compact rugged electronics and sensors* Adjustable gain for up to 22 volts output (with 24 Vdc input)* Temperature tolerant sensors (to 400°F)* High speed (10 KHz) level adjustable switched output for process control* Very low switching hysteresis, < 1% on ferrous targets* RoHS compliant

  • Network Interface Controller

    SPIDAR® - Sensors and Software Inc.

    User interface and data acquisition embedded on the NIC:1. Any device with Wi-Fi can be used to change settings or view data collection2. No data collection interruption or data loss occurs if connection to PC or device is interrupted. No reduction in speed compared to running a single system. Daisy-chain NICs to deploy any number of GPR systems simultaneously; build Multi-frequency systems or Multi-channel Array systems Advanced timing control to ensure no interference between GPR systems

  • Eddy Current Dynamometers

    WT Dyno - HORIBA, Ltd.

    Our WT series eddy current dynamometers are mainly used in the development and testing of all types of prime mover, as well as various engine assemblies. Due to their robust design, which incorporates improved control characteristics, they can be used both as steady state and as transient test stands.Their high speeds for automobile engine testing and their optimised cooling chamber, are convincing arguments that speak for themselves. All WT type dynamometers are suitable for operation in both directions of rotation.

  • Bluetooth Advanced Measurement System

    IQxel-M - LitePoint Corporation

    The new LitePoint IQxel-M™ Bluetooth Advanced measurement system is a major advancement in the speed and efficiency for performing over-the-air testing of Bluetooth Low Energy peripheral and beacon devices. Using LitePoint’s proprietary measurement techniques, testing Bluetooth devices has been made simple and the system performs comprehensive transmitter and receiver measurements in a matter of seconds. The solution is optimized for both engineering and manufacturing and works with all BLE peripheral and beacon devices, regardless of chipset.

  • Wire Crimp Testers

    IMADA, Incorporated

    Imada offers manual and motorized wire crimp test systems in either vertical or horizontal configurations.Lever-operated systems offer basic functionality and rapid destructive testing up to 220 lbf.Motorized systems have speed control and are capable of destructive or force-controlled non-destructive testing up to 1100 lbf.Choose from manual or automatic wire-gripping fixtures.Digital gauges offer data output for analysis with data acquisition software.Create your own custom configuration or consult our application specialists.

  • Compact Photon Counting X-Ray Detector

    HyPix-3000 - Rigaku Corp.

    Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.

  • ADQ Development Kit for Custom Firmware in the FPGA of an ADQ-Series Digitizer

    Teledyne SP Devices

    The ADQ Development Kit is a tool for developing custom firmware in the FPGA of an ADQ-series digitizer. SP Devices’ digitizers are characterized by a combination of high speed and high resolution.The amount of data from the digitizer is thus very high. The most efficient way of processing the data is through a real-time implementation inside the FPGA on the digitizer. The ADQ Development Kit opens the FPGA for the implementation of real-time signal processing algorithms.The ADQ Development Kit is available for all digitizer models.

  • LCZ LCR Meter

    SS1063 - Sanshine Electronis Co., Ltd.

    This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.

  • DSP And Power Amplifier

    DMPA12 - Lectrosonics, Inc.

    The DMPA12 is a powerful digital audio processor and multi-channel power amplifier combined into a single rack space component designed to work with DM Series processors. The design represents a milestone in DSP technology in its basic architecture and in its processing speed and efficiency. The primary applications are sound reinforcement and teleconferencing in boardrooms, courtrooms, worship centers, distance learning systems, hotels and other applications with multiple microphones and loudspeakers. The design is ideally suited to mix-minus sound reinforcement systems.

  • Energy Dispersive Spectroscopy (EDS) Platform

    Octane Elect EDS System - EDAX

    The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.

  • Wind Sensors

    FT742 - FT Technologies

    The FT742 measures wind speeds up to 75 m/s. Its innovative design incorporates a series of “turbulators” which condition the air flow to deliver our highest levels of accuracy yet. Available in four mounting options, the Flat Front (FF) and Pipe Mount (PM) are typically used in wind turbine control and the Direct Mount (DM) in meteorological applications. The Surface Mount (SM) has been specifically designed for OEM integration and for use on UAVs/drones.

  • High Impedance Active Probes

    12C - Picoprobe

    A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.

  • NI-9775 , ±10 V, Up to 20 MS/s/ch, 14-Bit, 4-Channel C Series Digitizer Module

    784539-01 - NI

    The NI-9775 provides referenced single-ended analog inputs with two timing modes for applications such as fault detection in electrical transmission lines or structural failure events. You can use the NI-9775 to measure finite samples up to 20 MS/s/ch to capture fault detections or to measure continuously at up to 4 MS/s. You also can use the built-in analog reference trigger to assist with high speed phenomena. Additionally, the NI-9775 supports waveform streaming at a lower sample rate.

  • Memory Test System

    T5835 - Advantest Corp.

    The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.

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