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Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
- Pickering Interfaces Inc.
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100-Pin Micro-D Connector, Male, Discrete Wire, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CW-6A
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Narrow (Fine) Pitch Connectors
Panasonic Industrial Devices Sales Company of America
Panasonic’s industry leading “tough contact” design provides customers with the reliability that is required when developing the latest computer or wearable device. Our Narrow (Fine) Pitch Connectors line-up includes both Board-to-Board and Board-to-FPC options. Backed by our staff of technical engineers, Panasonic offers a full “hands on” solution from designing-in assistance to manufacturing. Discover how Panasonic Narrow Pitch Connectors can elevate your applications.
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Fine Pitch Connector Test
C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Fine Pitch Stencil Printer
MC110
MC110 SMT stencil printer offers quick and easy setup via tooling hole or edge mounting for both single and double-sided boards. Exceptional build quality, with a heavy-duty cast aluminum base, ensures stability and repeatability.
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Signal Integrity Test Products
RoBAT SCARA-PDM
*Compliant Pin Depth Machine for both Backplanes and Linecards*Very cost-effective solution*Will also detect miss-pressed connectors*All sizes of compliant pin, from fine pitch high speed, through to larger power pins
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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100-Pin Micro-D Connector, Male, Ribbon Cable, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CR-6A
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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68-Pin VHDCI Connector, Slimline - Male, Solder
C068VMR-6SB-6A
This slimline version of the VHDCI connector is designed to allow users to directly terminate a cable with soldered connections to the 68 Way VHDCI connector. It is difficult to terminate cable to the 68 pin VHDCI because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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RF Test Fixture System
CAM/TRAC ®
The Camtrac (registered trademark) series test fixtures provides ‘Z’ axis motion that reduces probe side loading typically seen with Clamshell type test fixtures. This not only extend the life of the probes, but additionally, provide better probing accuracy, especially on fine pitch test centers. Camtrac fixtures are available with the most widely used interfaces in the test industry.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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CMOS Image Sensor
CIS
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
