Showing results: 31 - 45 of 60 items found.
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58602 -
Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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58604 -
Chroma ATE Inc.
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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3680 -
Chroma ATE Inc.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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3650 -
Chroma ATE Inc.
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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3650-EX -
Chroma ATE Inc.
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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PXIe-6943 -
Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Astronics Corporation
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Astronics Corporation
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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E9902G -
Keysight Technologies
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Shanghai Guantu Technology Co., Ltd.
How the AC test transformer prevents the overvoltage generated by the frequency conversion series resonance test device is a relatively simple problem, but the overvoltage caused by voltage fluctuation is difficult to appear when the overvoltage protection is set. Generally, the overvoltage of the frequency conversion series resonance test device will appear in the frequency sweep stage of the instrument, that is, in the process of finding the resonance point. Those who have used it know that in the process of finding the resonance point of the frequency conversion series resonance test device, the voltage and frequency have a parabola-like linear relationship. By default, the system finds the high voltage, that is, the apex of the parabola as the resonance point.
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MFS-MG MAGNUM -
SpectraQuest, Inc.
The MFS-MG fitted with a resonance kit is the perfect tool to gain practical experience in rotating machinery resonance and to learn resonance mitigation methods. With a different number of rotor disks installed at various locations on the main shaft, resonances up to the third mode can be excited. The bode plot of the main shaft vibration during a coast down test is illustrated in the right figure.
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KD-9363EM-Analysis shaker -
King Design Industrial Co., Ltd.
This machine can test the structural properties of materials, manual fine-tuning vibration frequency can perform single-point resonance search and presence; after shaking, capture resonance excitation modal analysis data for future use.
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