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Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
- Pickering Interfaces Ltd.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Impact Test Apparatus
SCR Elektroniks make Impact Test Apparatus is used to test the Electrical Accessories / appliances for their mechanical strength.
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Impact Test Apparatus
IT-50
Impact test is an essential physical test prescribed in many standards to test samples for mechanical shock. It is designed to perform such tests. The test is carried out to ensure that the test items have adequate mechanical strength to withstand the stresses and rough handling imposed during installation and use. It is adapted to test various types of electrical accessories such as switches, sockets, plugs, starter seats and other electrical appliances.
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Digital Impact Test Machine
The Digital Impact Testing Machine mainly used to determine the anti-impact capability and strengthen impact toughness of non metallic materials such as nylon, glass fiber reinforced plastic, ceramic & cast stone, electrical insulating materials etc.Sample and support are easy centeringThe pendulum of the machine can be raised or released automatically by button pressedDigital LCD screen control and value displayThe machine comply with GB / T1843, ISO 180, GB / T21189, GB / T2611 and other international standard
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2 Inch 535g Steel Impact Ball For Impact Test
CX-B2
Shenzhen Chuangxin Instruments Co., Ltd.
2 inch 535g steel impact ball for impact test
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1040g Steel Impact Ball Drop Impact Test Ball
CX-B104
Shenzhen Chuangxin Instruments Co., Ltd.
1040g Steel impact ball drop impact test ball
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IEC60669 Pendulum Impact Test Machine
CX-BC1
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60669 Pendulum Impact Test Machine
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2.3KG Steel Impact Test Ball
CX-325
Shenzhen Chuangxin Instruments Co., Ltd.
UL858 2.3KG Steel Impact Test Ball
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IEC60950 50mm Impact Test Balls
CX-15
Shenzhen Chuangxin Instruments Co., Ltd.
The Impact Test Ball is a specially machined ball to test impact resistance according to IEC, CSA and UL Standards. It is made of chrome-plated-steel for durability, and is fitted with an eyelet to facilitate testing for pendulum applications. Eyelet is threaded to the ball to allow attachment of a handle or force gauge. Weights are closely controlled.
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High Impact Shock Test System
KRD16 series
High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Heavy Impact Tester, Battery Safety Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's battery impact tester tests the safety of the battery through different weights, different heights and different impact areas. After a series of tests on this battery impact tester, the battery must not have flame or explosion.
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Particle Impact Noise Detection (PIND) Test
This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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IEC60950 Ball Drop Impact Test Apparatus
Shenzhen Chuangxin Instruments Co., Ltd.
It is mainly used for mechanical strength testing equipment enclosure, test equipment enclosure should be able to ensure that the structure can be expected to withstand the operation does not produce within the provisions of the standard risk for damage to the outer surface of the enclosure will touch dangerous parts of the apparatus.
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IEC60884 Fig22 Plug Socket Covers Pendulum Impact Test Apparatus
CX-BC22
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig22 plug socket covers pendulum impact test apparatusMeet the standard: IEC884-1 Figure 22-26,, IEC60068-2-75Uses: Suitable for household and similar plugs and sockets, wall mounted mounting boxes, screw glands, covers, switches and other electrical accessories for mechanical strength test
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
