Showing results: 91 - 105 of 364 items found.
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Si APDs -
LT Laser Tools GmbH
Silicon avalanche photodiodes are used in the wavelength range between 250 nm and 1100 nm. The avalanche effect of these photodiodes makes them well suited for the detection of extremely weak light intensities.
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VLSI Standards, Inc.
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Silicon Labs
Silicon Labs' CMOS digital isolator products enable lower cost, smaller size, higher performance, lower power, and more reliable isolated circuits than competing optocoupler solutions. The Si80xx, Si83xx, Si86xx, Si87xx, and Si88xx families of one to six-channel bi- and unidirectional digital isolators support isolation voltage ratings up to 5 kV. With a broad product portfolio, a proven track record of industry innovation and an unwavering commitment to engineering excellence Silicon Labs isolation technology is ready to meet your isolation needs.
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Digital ST60 Thermopile (Preliminary) -
Dexter Research Center, Inc.
A single channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. The small active area size is 0.61mm x 0.61mm.
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HS-NCS-300 -
HenergySolar
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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AllianceATE Consulting Group, Inc
Test and product engineering services to both large corporations and small companies who needs support in their silicon development cycle.. Full Service Test Support - Design to Test Automation - Yield Analysis.......
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Digital ST60 Dual Thermopile (Preliminary) -
Dexter Research Center, Inc.
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 0.61mm x 0.61mm.
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Digital ST120 Dual Thermopile (Preliminary) -
Dexter Research Center, Inc.
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 1.2mm x 1.2mm.
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Bunkoukeiki Co., Ltd
It is used to measure the spectral response (spectral sensitivity) of photoelectric conversion devices (photodetectors / sensors) such as silicon photodiodes and CCD · CMOS image sensors . Measurement in the broadband wavelength region can be performed with low stray light.
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NSX -
Onto Innovation
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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EDS (SEM) Applications -
Amptek Inc.
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
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Renesas Electronics Corp.
DC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon phototransistor. This type is suitable for applications such as I/O interfaces and signal transmission circuits.
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Active Silicon
Active Silicon offers a range of autofocus-zoom block cameras. Camera features include multiple output options, compact size, global shutter, powerful zoom and our own range of Harrier cost-effective block cameras.
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QUANTAX FlatQUAD -
Bruker microCT
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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