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Mechanical Test
material and physical properties.
- Pickering Interfaces Inc.
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PXI High Density MUX BRIC, 32-Chan, 10-Pole
40-570-412
This range of High-Density Multiplexer is part of our BRIC family. These MUX's are designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is also possible, without limitation). These multiplexers are ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. They are available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts. All version are supported in a BRIC8 construction that occupies eight PXI 3U mechanical slots, one of which provides the PXI interface and power.
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Mechanical Test Fixtures
MMI series man-machine interface
Designed to meet the needs of the most discerning customers and the latest market demands, our MMI series guarantees a natural posture for both the operator and the sitting position when performing the test on the adapter. The newly developed lever mechanism, which has been registered as a utility model, is specially adapted to the hand movement of its employee and ensures a heart-loving strain on the operator.
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Mechanical Test Service
The mechanical properties of an electronic system enclosure have to be stressed in order to determine the robustness of the total system. The multiple electrical interconnections have our special attention.
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Terminal Mechanical Strength Test
The terminal strength test is used to performed to determine whether the design of electrical terminals and their method of attachment can withstand mechanical stresses to which they will be subjected during installation or disassembly in equipment. These stresses must be withstood by the component without sustaining damage which would affect either the integrity of the terminals or the operation of the component part itself. Procedures are established in this method for testing, for example wire-lead terminals, flexible-flat-strip or tab-lead terminals, and rigid-type terminals which are threaded or have other arrangements for attaching conductors. The forces applied during the test consist of direct axial, radial or tension pulls, twist, bending torsion, and the torque exerted by the application of nuts or screws on threaded terminals.
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Mechanical Bench-top Test Jigs
CGF Series
Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
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ElectroForce Mechanical Test Instruments
We start with your specific testing needs and combine unique ElectroForce motor technologies with our test applications engineering expertise to create a tailored test solution that meets your testing objectives. After you buy a TA Electroforce product, you become a valued, lifelong customer. Providing exceptional, ongoing support is our commitment to you.
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MECHANICAL TEST FIXTURE KITS
TX-MT-SERIES
Test-X MT Series mechanical kits are an affordable solution to printed circuit board testing. With multiple configurations and available options, this product is sure to meet your testing needs. The MT Series features a hinged 3/8" FR4 probe plate, tooling holes for accurate drilling, and side handles for easy transportation.
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MECHANICAL TEST FIXTURE KITS
TX-MT-100 SERES
Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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Mechanical Shock Test System
BW-MST-E5000
The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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Test Stands: Mechanical and Motorized
SHIMPO offers both motorized and mechnical test stands suitable for the most precise testing applications.
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Test Adapters/ Mechanical Interchangeable Adapters
GPS Prüftechnik offers a wide range of mechanical adapters. These are mostly used for functional tests.
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4-in-1 OSLT Mechanical Calibration Kit, DC To 9 GHz
85515A
The 85515A 4-in-1 mechanical calibration module combines an open, short, load, and through in a compact unit. The product is small, easy to handle, and light weight. The through allows users to easily calibrate non-insertable devices, such as a cable or filter with female-female connectors. During the “thru” part of the calibration, the 85515A through can be used.
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4-in-1 OSLT Mechanical Calibration Kit, DC To 18 GHz, Type-N (m) 50 Ohm
85518A
Easily calibrate non-insertable devices with this module combining an open, short, load, and through in a compact unit
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4-In-1 OSLT Mechanical Calibration Kit, DC To 18 GHz, Type-N (f) 50 Ohm
85519A
Easily calibrate non-insertable devices with this module combining an open, short, load, and through in a compact unit
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
