Showing results: 1 - 15 of 89 items found.
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COMP0804CAP -
EMC Partner AG
Active flammability test system according to IEC 60384-14 Ed4. For testing X & Ycapacitors up to 1uF. The test system includes control of the nominal AC supply via an integrated variac up to 1800V. Impulse amplitudes are programmable up to 8kV which covers all requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV.
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Aero Nav Laboratories, Inc.
Fire & Flammability testing: ASTM E119 [UL 263]; ASTM E152 [UL 10C]; ASTM E814 [UL 1479]; API 607, 6A; ASTM E108 [UL 790]; UL 1709; UL 1715; UL 2043; NFPA 286; UBC 26-2; UBC 26-3; ASTM E84 [NFPA 255, UL 723]; ASTM E162; ASTM E662 [NFPA 258]; ASTM D635; ASTM D1929; ASTM D2863; ASTM E1354; ASTM E1317; Room Burn Facility; CAL 133, 117, 129; UL 94 V/HB; IMO A.652 (16); IMO A.653 (16); ULVW I; ASTM D2859; AITM 2.0007; NFPA 701; FMVSS 302; FAA 25.853; IEEE 383
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CTS-6010 -
Astronics Corporation
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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Astronics Corporation
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Bloomy Controls, Inc.
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Chroma ATE Inc.
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Chroma ATE Inc.
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Astronics Corporation
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Astronics Corporation
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.