Showing results: 166 - 180 of 347 items found.
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I-Stop -
Trilithic Inc.
The I-Stop Reverse Test Probe is a test accessory designed for use with most signal level meters and with the Trilithic 9580 Return Maintenance System. Screw the probe into a distribution tap's unused KS port and a spring-loaded "stinger" connects a 20 dB resistive test point circuit to the hardline.
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Hilo Test
The ESD Simulators ESD suitable for performing EMC tests of systems and equipment according to the standards IEC / EN 61000-4-2 and ISO / TR 10605. It can far beyond the standard boundaries higher test levels are adjusted. Depending on the device under test and the test setup are two test method shall be: Air discharge (AIR) and contact discharge (CON).
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SYSTEM 8 (BFL) -
ABI Electronics Ltd
The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applications.
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Hysitron TS 77 Select -
Bruker microCT
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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WaveCore™ Products -
Textron Systems
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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K8223B -
Keysight Technologies
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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K8223A -
Keysight Technologies
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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Pickering Interfaces Ltd.
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
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Power Diagnostix Systems GmbH
This group of instruments offer partial discharge measurement functions of different performance level. Devices for test and research laboratories as well as systems for on-site PD analysis are available. Stand alone units, computer controlled systems or wireless operating acquisition sets are shown in this area.
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Precision Milimeter Wave
Standard gain horns can be used to experimentally determine the gain of other antennas by using the substitution method. The standard gain horn and the antenna under test are alternately connected to a well matched detector system in order to compare their relative power levels. The power level difference is then added to the appropriate level of the calibration curve to determine the absolute gain of the antenna under test.View more Standard Gain Horn Antennas
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Apollon -
Afore
APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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ELMA Electronic, Inc.
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To compliment our wide range of systems, Elma offers a comprehensive range of system level accessories, including: I/O solutions, HMI displays, system/power management controllers and test & development boards.
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141 -
STAR-Dundee
The SpaceWire Physical Layer Tester (SPLT) is a tool designed to test, validate and verify a SpaceWire system across all levels of the SpaceWire standard. Two SpaceWire ports employ a special LVDS interface which allows the transmitted signals to be deliberately and measurably manipulated to test the capability of a unit under test to receive signals of varying quality.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.