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Leaky Insulator Detector (LID) Camera
CORONA CAMERA
The Leaky Insulator Detector (LID) is two-piece hand held non-destructive inspection system which utilizes AC/DC Current sensor and Ultrasonic technology for predictive maintenance. The Leaky Insulator Detector (LID) has a Flexible clamp sensor and Ultrasound Receiver.
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Reelsurance
LCi-18 RFID
Reelsurance LCi-18 RFID Label Counting and Inspection System with Tagsurance verifies the tag operation sensitivity using communications tests at several frequency and power level combinations with high resolution, stability and high speed. The system provides also accurate label counting, missing label detection and label dispensing of required quantities.
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Photomask Stations
Fast, sensitive, economic, off-line photomask defect review. Our 300 series photomask inspection and review stations use long working-distance microscopy and a unique four-way lighting system to greatly speed up location and identification of micron- and submicron-sized defects
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Digital Motorized BRINELL Hardness Tester
900-355
Load Cell driven system provides precise control of test force application Direct digital reading Engineered to obtain highly sensitive and accurate readings Perfect for laboratories, workshops, tool rooms, inspection labs, etc. Measuring Range: 8-650HBW
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Machine Vision Software
AutoVISION®
Microscan’s AutoVISION is the easiest machine vision software available for basic to mid-range vision applications. Process and manufacturing engineers no longer need to become experts in machine vision in order to successfully deploy a system that meets their traceability, inspection and quality control needs.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Entry Level AOI
iSpector
The Mek iSpector series AOI machines are fully compatible with Mek’s Catch System for classification, repair and SPC, utilizing the same powerful 22X software that is used in the premier Mek PowerSpector series. There is no compromise on the wide range of inspection algorithms and component libraries.
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Endoscopes
Originally designed for the medical sector, endoscopes are the ideal tool for inspection and maintenance today. Endoscopes offer new perspectives to viewing the insides of machines. Thanks to their flexible fibre optic cables and light weight enclosure, these extraordinary endoscopes are the ideal tool for inspection and maintenance. Endoscopes can locate problems and conflicts of the system very easily and quickly, allowing for preventative measures to be taken without the need to dismantle the machinery first. Complex dismantling of machines is usually very time and cost intensive. With the help of endoscopes, inspections in an industrial sector can therefore be organized considerably faster, more aimed and more cost-efficiently Endoscopes are used mainly by electricians, security personnel, specialists in the professional sector, and mechanics of all types. All of our endoscopes are ***Not for medical use***
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Batch AOI Machine
Sherlock-300B
Compact Sherlock 300B batch PCB inspection (AOI) system provides manufacturers with the benefits of inline AOI—hands-off board handling, automatic good/bad board sorting and minimal operator interaction—in the convenience and flexibility of a standalone AOI station that can be located anywhere in the facility and used to process boards from multiple production lines, including production lines that aren't inline/automated, such as smaller and benchtop lines. With an average cycle time of 10 seconds per board (including transport), Sherlock 300B automated optical inspection (AOI) machine can be used for everything from first article to 100% inspection for increased quality and production yields. (Cycle time measured using a 7.3" x 5.1" (185 x 130 mm) PCB with 253 parts.)
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Vision System
Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.
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ECHO VS System with Image Enhancement
Echo VS
The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.
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microLED Testing System
OmniPix-ML1000
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Optics Test Equipment
MTF Measuring Systems For Industrial Applications
Optik Elektronik Gerätetechnik GmbH
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching.
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Ultrasonic Rotary Mechanisms For High Speed Testing Of Round Bar And Tubular Products
ECHOMAC® ULTRASONIC ROTARIES
High-speed Ultrasonic (UT) Systems enable a full volumetric examination of materials and are designed to detect surface, subsurface, internal and dimensional flaws. This type of testing utilizes high-frequency sound waves that are transmitted throughout the material being tested in order to conduct a thorough inspection.
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MTF Measuring Systems For Industrial Applications
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching
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LCZ LCR Meter
SS1062
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
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LCZ LCR Meter
SS1061
LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
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Solar InspectionSystems
Exact measurements and sorting criteria make it possible to quickly recognize problems in the process quality and to react immediately. This allows increasing the production yield and guaranteeing reproducible quality in the final inspection.With an Intego system, you get an individually designed inspection system, which fits optimally in your specific production process. The modular construction of our systems is based on developed and tested standard components.
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Tool and Process Monitoring
BK MIKRO
BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Integrated Turbine Rotor Measurement and Assembly Platforms
iMAP
Rotary Precision Instruments UK Ltd
Improve productivity and achieve higher levels of quality by reducing inspection times and the need for costly teardowns due to inefficient rotor assembly. iMAP is the definitive system for productivity improvement in turbine rotor assembly for large volume and heavy loads such as aircraft engines and gas turbines.
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Color Sensors
Leuze electronic GmbH + Co. KG
Color sensors detect colors by comparing the detected color value with a previously stored reference value. They are the right solution whenever the color of an object or marking can serve as a sorting or inspection criteria. Depending on the configuration and specified tolerance values of the system, the result is output as a switching signal.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Corona Effect Camera
CoroCAM 7
The CoroCAM 7 corona effect camera is a camera used to visualize and locate corona and electric arc discharges. This camera shares the same ultraviolet imaging system as coroCAM 6D, but additionally combines it with a high-performance visible camera and viewfinder. This camera is used for high voltage inspections.
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Vision Measurement
CMM Camera System
Aberlink’s camera system offers a non-contact facility on any Aberlink CMM. A innovative design of magnetic, kinematic joint allows the probe and camera to be swapped in just seconds. This means that components can be inspected using both touch trigger and vision inspection technology on the same machine.
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Four-sided Cant Scanning
Logeye 600
The Logeye 600 scanner is designed to analyze wooden cants in the sawmilling production process. The aim is to integrate the machine into profiler lines and into re-saws for high quality lumber production. The combination of automatic quality inspection allows an autonomous system for superior grade and high volume production.
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Vacuum Inspection
INDEC
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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Constant Temperature & Humidity Chamber
DRK-150F
Shandong Drick Instruments Co., Ltd.
The constant temperature and humidity chamber has an accurate temperature and humidity control system, which provides various environmental simulation conditions required for industrial research and biotechnology testing, so it can be widely used in sterility tests, stability inspections such as pharmaceuticals, textiles, and food processing.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Automated Test Equipment
Viewpoint Systems offers design verification and manufacturing quality inspection systems to help customers reduce human error in repetitive tests, increase testing speeds, and ultimately get products to market faster at a lower cost. Viewpoint Transforms Test from Design to End-of-Line. Our R&D test systems are designed with the flexibility to validate ever-changing prototypes while accelerating your development schedule.