Showing results: 391 - 405 of 607 items found.
-
Optoplex Corporation
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching
-
SS1062 -
Sanshine Electronis Co., Ltd.
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
-
SS1061 -
Sanshine Electronis Co., Ltd.
LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
-
Intego GmbH
Exact measurements and sorting criteria make it possible to quickly recognize problems in the process quality and to react immediately. This allows increasing the production yield and guaranteeing reproducible quality in the final inspection.With an Intego system, you get an individually designed inspection system, which fits optimally in your specific production process. The modular construction of our systems is based on developed and tested standard components.
-
BK MIKRO -
Techna-Tool Inc.
BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
-
iMAP -
Rotary Precision Instruments UK Ltd
Improve productivity and achieve higher levels of quality by reducing inspection times and the need for costly teardowns due to inefficient rotor assembly. iMAP is the definitive system for productivity improvement in turbine rotor assembly for large volume and heavy loads such as aircraft engines and gas turbines.
-
Leuze electronic GmbH + Co. KG
Color sensors detect colors by comparing the detected color value with a previously stored reference value. They are the right solution whenever the color of an object or marking can serve as a sorting or inspection criteria. Depending on the configuration and specified tolerance values of the system, the result is output as a switching signal.
-
RAM-DROP -
The Modal Shop, Inc.
The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
-
CoroCAM 7 -
Amperis sl
The CoroCAM 7 corona effect camera is a camera used to visualize and locate corona and electric arc discharges. This camera shares the same ultraviolet imaging system as coroCAM 6D, but additionally combines it with a high-performance visible camera and viewfinder. This camera is used for high voltage inspections.
-
CMM Camera System -
Aberlink Ltd
Aberlink’s camera system offers a non-contact facility on any Aberlink CMM. A innovative design of magnetic, kinematic joint allows the probe and camera to be swapped in just seconds. This means that components can be inspected using both touch trigger and vision inspection technology on the same machine.
-
Logeye 600 -
Microtec
The Logeye 600 scanner is designed to analyze wooden cants in the sawmilling production process. The aim is to integrate the machine into profiler lines and into re-saws for high quality lumber production. The combination of automatic quality inspection allows an autonomous system for superior grade and high volume production.
-
INDEC -
KoCoS Messtechnik AG
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
-
DRK-150F -
Shandong Drick Instruments Co., Ltd.
The constant temperature and humidity chamber has an accurate temperature and humidity control system, which provides various environmental simulation conditions required for industrial research and biotechnology testing, so it can be widely used in sterility tests, stability inspections such as pharmaceuticals, textiles, and food processing.
-
KLA-Tencor Corp
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
-
MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
