Filter Results By:

Products

Applications

Manufacturers

Data Pattern

Produce data patterns for the assurance of logic circuits and digital semiconductors.


Showing results: 136 - 150 of 155 items found.

  • Communication Test Set

    Eye-BERT 100G - Spectronix

    The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.

  • Error Detector Remote Head 32 and 17 Gb/s

    N4952A - Keysight Technologies

    The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.

  • Infrastructure

    dsTest - Developing Solutions, Inc.

    dsTest offers server emulation and client simulation capabilities for comprehensive testing of 3GPP core network interface functionality and performance. Select the interfaces required to accomplish your testing goals–surround a network element with client simulators that simulate client activity,  or provision a server emulator with the interfaces necessary to support end-to-end testing, test agents and proxies using both client simulation and server emulation. Test your LTE, EPC, eMBMS, SMS, WLAN Offload, VoLTE and CIoT networks, or gather Big Data to support the identification of patterns and that will provide new business opportunities, revenues, and efficiencies  to network operations.

  • FMC, XMC & PMC

    Data Patterns Pvt. Ltd.

    The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.

  • MMW Field Sensors

    ITS-9050 - Innovative Technical Systems

    The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.

  • Cable Testers

    Meilhaus Electronic GmbH

    Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.

  • VLSI Test Systems

    Chroma ATE Inc.

    50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P

  • ARM Elevator Board

    MS 1517 - Meltronics Systemtech

    - Works with 2 wires, supplied with landing displays and communication with "CAN" processor- Provides field-proven perfomance, lifetime support commitment.- Remote communication with modem and suitable software enables user to download the system history from remote location- Monitor and control elevators inn real time-across campus or country.- Group Control Available upto 64floors and 6 cars.- Displays car and hall calls, waiting times and Data Log Information on a color screen.- Stores information during the working day.- Self learning call allocation, allows system to read day by day call history and respond to the unexpected travel patterns from previous experience

  • Antenna Measurement Software

    Raymond RF Measurements Corp.

    Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.

  • Central Office Line Simulator

    AI-7280 - Advent Instruments Inc.

    The AI-7280 is a highly flexible central office line simulator. It is designed primarily for the testing and verification of common terminal equipment, including standard telephones, Caller ID devices, SMS (Short Message Service) capable equipment, and any device using an analog Tip/Ring interface circuit. Supplied with the TRsSim software for Windows, it can analyze a telephone''s DTMF characteristics, pulse dialing and flash timing, generate various network tones and ringing patterns. Both Type I (on-hook) and Type II (off-hook) Caller ID is supported using either FSK or DTMF data transmission. As an optional component, the TRsSim software can perform SMS testing to either the ETSI protocol 1 or protocol 2 standards.

  • Clock Drivers

    Pulse Instruments

    Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.

  • Test Solution

    Eye-BERT MicroX - Spectronix

    The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions.  The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps.  Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information.  Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability).  With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results.  The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.

  • Portable PD Monitoring of Medium and High Voltage Power Equipment with UHF, AE, and HFCT

    PDiagnosticM - Power Monitoring and Diagnostic Technology Ltd.

    The PDiagnosticM is a portable system that utilizes UHF, AE, and HFCT sensor modules to monitor PD signals from Medium and High Voltage power equipment.The system is ideal for monitoring critical power assets to find and monitor intermittent PD signals and to analyze the developing PD trends. The PD type is determined by automatic pattern recognition and internal defects can be found at an early stage.The system provides advanced protection with alarm functions and our Deep Learning data analysis capabilities utilizing our proprietary Intelligent Cloud Diagnostic Technology.

  • Dual Channel Bit Synchronizer for Rates up to 45 Mbps

    LS-45-DB - Lumistar Inc.

    The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.

  • Multi-Wafer Test & Burn-in System

    FOX-XP - Aehr Test Systems

    The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.

Get Help