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Functional Test

black box type testing via interface level inputs and resulting output analysis.

See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line


Showing results: 661 - 675 of 735 items found.

  • 64 MB RAM Tester

    IST-6500 - IST Information Scan Technology, Inc.

    The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.

  • AMIDA 2020XP Tester

    Amida Technology, Inc.

    AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end

  • Noise & Vibration Testers

    WinTek s.a.s.

    System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).

  • Test for Pacemakers

    LXinstruments GmbH

    VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.

  • ATE Development

    Aero Engineering Support Group

    ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:

  • Universal Function Test System for Industrial Electronics

    LXinstruments GmbH

    General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.

  • 1553 Avionics Interface 3U cPCI Card

    QCP-1553 - Terotest Systems Ltd.

    The QCP-1553 module is a rugged, reliable, full featured, Compact PCI module designed to provide a stand-alone, MIL-STD-1553A/B interface for avionics applications. Up to four independent dual redundant MIL-STD-1553 databus streams are supported by the 3U QCP-1553 module. Additionally, the module offers full functional test, simulation, monitoring and databus analyzer functions for MILSTD-1553A/B applications. An onboard IRIG-B time code decoder and generator allows users to accurately synchronize single or multiple QCP-1553 modules to a common time source.

  • Weld Testers

    ACM Instruments

    The Weld Tester is our most versatile electrochemical monitoring instrument. Housed in a substantial metal case with brushed anodised aluminium front panel and green military specification connectors this equipment looks functional and professional. The top row of connectors are exactly the same as provided on a Gill 12 whilst the bottom row are for the additional weld segments. Using the same Potentiostat, Galvanostat, Zero Resistance Ammeter with integrated Frequency Response Analyser and Sweep Generator as a Gill 12 allows all the tests supplied with the Gill 12 to be supplied with the Weld Tester.

  • Flight Line Avionics Test

    Astronics Corporation

    The TS 717 Test Set for ARINC 717 is a convenient, easy-to-use tool for test and maintenance of aircraft systems that are tied to the Digital Flight Data Recorder (DFDR). The compact interface/cable hardware is conveniently stored in a rugged carrying case for easy transport and quick deployment.The webFLT™ is a wireless functional tester for aircraft systems using the Digital Flight Data Recorder ARINC 717 bus. It connects directly to the aircraft system test plug and transfers data to the test computer via an 802.11 b/g wireless link, eliminating cabling in the crowded cockpit that can be tripped over or damaged.

  • VXI

    Data Patterns Pvt. Ltd.

    VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.

  • Flying Probe Tester

    Pilot 4D L4 - SEICA SpA

    The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).

  • Power Conversion Automated Test Platform

    C8000 - Chroma Systems Solutions, Inc.

    Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.

  • Test & Test Development for Circuit Card Assembly

    Teledyne Defense Electronics

    Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW

  • Test Automation Services

    ImpactQA

    Automating software products and applications at ImpactQA is performed with an aim to reduce regression testing time and time-to-market. Ouryears of experience and shining reputation among top automation testing companies have strengthened our engagement with global clients from different industry domains. ImpactQA and its test automation approach involve best in class tools for functional regression automation and webapplication automation testing partnered with creation & maintenance of automated test suites. Our true asset is the availability of IP-driven tools and custom test automation framework that permits cross-platform application testing for both web and mobile applications.

  • SoftTest Design Testing Services

    SofTest Designs Corporation

    We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.

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