Showing results: 196 - 210 of 747 items found.
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APE429-x -
AIM GmbH
ARINC429 Test and Simulation modules with 4, 8, 16 or 32 Software programmable Tx/Rx channels plus up to 8 Discrete I/O’s. The APE429-x is a functional replacement for the models API429-x/APX429-x.
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APEX3910-EN -
AIM GmbH
Single Stream STANAG3910 Test and Simulation module – Rafale – for PCI Express with 1 dual redundant HS/LS channel and onboard Electrical Front End (EFE). The APEX3910-EN is a functional replacement for APE3910-EN.
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48655 -
Hopkins Manufacturing Corporation
Quickly and easily confirm if your vehicle 4 flat connector wiring is properly installed and functional. Fits on your keychain to keep it handy! LEDs test left/right turn, brake and taillight.
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393 -
Aircraft Instrument Support Services, Inc.
*Perform complete Pitot-Static systems functional and leak test*Highly accurate*Built-in safety features*Models available for operation on 115v, 220v and/or no power*Portable hand pump operation
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50-297-101 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-002 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-003 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-103 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-102 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-001 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-297-030 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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MicroContact AG
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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NetUSB II™ -
Corelis, Inc.
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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ZAP-fiX -
ZapTest, Inc.
ZAP-fiX is an add-in for HP (UFT) Unified Functional Testing, it extends HP UFT for test automation on Mobile; Win; Mac; and Linux in Cross-Platform fashion. ZAP-fiX allows HP UFT users to create test automation in order to support Agile/CI development methodologies.
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.