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Sapphire 3D Microscope
WDI-2000
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Sapphire polariscope optic modulator
PKS-250M
The device is designed for determining double refraction in flat blanks and products of transparent and weakly tinted materials, and is used for quantitative assessment of double refraction value by Senarmon method with an error of not greater than 10 nm, for assessment of double refraction distribution in an object by interference tinting, for examining distribution of double refraction in an object with circularly polarized light.
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Sapphire Defect Laser Probe and Glasses
LP-100
Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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Tunable, Ultrafast TI: Sapphire Laser
SPRITE XT
Sprite XT is a flexible ultrafast, femtosecond laser source. It delivers stability, reliability and productivity and is equally at home in the lab or as part of an OEM application. Choose your output power (up to multi-Watts), pulse width (femtosecond or picosecond models), wavelength range (fixed wavelength or tunable), and pulse repetition rate (<80 MHz to multi-GHz). All Sprite models are designed for alignment-free and maintenance-free operation and can be controlled from a web browser. It’s ideal for multi-photon excitation (MPE) and FLIM, quantum optics, time resolved spectroscopy, nonlinear optics, pump-probe experiments, microscopy, amplifier seeding, and electro-optic sampling.
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1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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Ultra Narrow Linewidth, CW TI: Sapphire Laser
SolsTiS
Award-winning SolsTiS is a next generation continuous-wave Ti:Sapphire laser designed to meet the needs of pioneering scientists looking for high performance, ease of use, system flexibility and reliability. This fully automated, compact system features a completely sealed, alignment-free cavity with hands-free operation, an unprecedented tuning range, unrivalled power, and the ultimate narrow linewidth, low noise output. SolsTiS has options of high power output up to 5W, linewidths <50 kHz and amplitude noise of less than 0.05%. SolsTiS is made to order giving you the ability to specify your linewidth, output power and wavelength range. Fully integrated accessories such as beam pick-off and fiber coupling are available.
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Ultra-Narrow Linewidth, CW TI: Sapphire Laser with Integrated Green Pump Laser
SolsTiS PI
An evolution based on our heritage in industrial semiconductor applications, SolsTiS PI combines our award-winning SolsTiS titanium sapphire laser with our Equinox green pump laser into a single, integrated platform offering unprecedented levels of stability, compactness and ease of use while retaining all the benefits of the continuous-wave, ultra-narrow linewidth and broadly tunable architecture that SolsTiS is known for.
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1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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One-box Femtosecond Ti:sapphire Lasers
TISSA
The TISSA is a series of mode-locked Ti: sapphire oscillators integrated with a pump laser.
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High Rigid Grinder
High-rigidity grinder is the device to grind the hard and brittle materials such as sapphire and Sic substrates that are considered to be hard-to-cut materials.
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Femtosecond Ti:sapphire Laser Kits
TISSA Series
TISSA kits contain all components of femtosecond Ti: sapphire oscillator preinstalled and tested on a breadboard and supplied with a cover box.
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Chemical Downstream Plasma Source
The AX7610 is a microwave plasma source for remote plasma applications. With replaceable quartz or sapphire plasma tubes, the AX7610 downstream source offers configuration flexibility to meet the most demanding application process parameters. The quartz tube version is ideally suited for production of atomic oxygen, nitrogen or argon. The sapphire tube version is compatible with much more severe CF4 CHF3 and NF3 chemistries.
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Femtosecond Multipass Ti:sapphire Amplifier
MPA 50
MPA 50 is a multipass Ti: sapphire amplifier based on a two-mirror confocal design and containing a pulse stretcher, a pulse compressor, a pulse picker, synchronization electronics, and the Faraday isolator.
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Single- Multielement Customized Infrared Detectors
LEPTON uncooled detector
Single element uncooled VPD PbSe detector, in 2 standard sizes: 1×1 mm2, 2×2 mm2, packaged in SMD or TO-5 (with cap, hermetic) with sapphire window
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Manual Contactless Wafer Detector
HS-NCS-300
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Silicon O/C Content Tester
OCT-2000
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Industrial Jewelry Parts
Adamant Namiki Precision Jewel Co Ltd.
Our product contribute to lengthening the life of machinery and products by using hard jewelry materials such as diamond · sapphire · ruby . As a result of sticking to the cutting of efforts, our strength is difficult to cut materials with various characteristics quickly and with high precision.
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Electrostatic Chucks
Chucks grip for micropatterning, temperature control, or robotics ...*insulating substrates,*hard disk drive head substrates,*semiconductor wafers,*InP-coated sapphire,*metal foils,*... and many other materials.
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Thin Film Circuits
SemiGen offers build-to-print services for a wide range of materials and metallization schemes. We use our processing technology to fabricate circuits on As-Fired Alumina, Polished Alumina, Superstrate TPS, Aluminum Nitride, Beryllium Oxide, Fused Silica/Quartz, Sapphire, and Hi-K Dielectrics.
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Femtosecond Terawatt Ti:sapphire Laser System
MPA-XL
MPA-XL is a cost-effective terawatt Ti: sapphire amplifier system. It gives up to 200 mJ energy of the stretched pulse and further compression with 65% efficiency. A standard air compressor can be placed into a custom designed vacuum chamber.
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Miniature High Resolution Underwater CCD Camera
L3C-720
The Teledyne Bowtech L3C-720 miniature high resolution underwater CCD camera, provides a low cost solution to general underwater viewing and observation.The camera housing is manufactured from high quality titanium fitted with a Sapphire glass window rated to either 1,000, 4,000 or 6,000 metres operating depth.
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Underwater Color Zoom CCD Camera
Surveyor-SD
The Teledyne Bowtech SURVEYOR-SD underwater colour zoom camera utilises CCD technology, delivering exceptional picture quality, with a 28:1 optical zoom lens and a horizontal resolution of 670 TV lines, all within a 4,000 (or 6,000) metre rated high quality titanium housing, with a 99.7% optically clear sapphire window.
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Low-Cost Fixed Focus Miniature High Definition Camera
L3C-HD
The Teledyne Bowtech L3C-HD is a low cost fixed focus miniature high definition camera. Its housing is manufactured with high quality titanium, rated to either 1,000m, 4,000m or 6,000m operating depth.The camera is fitted with a fixed focus wide angle lens. This provides a 67° diagonal angle of view in water. The Sapphire window is highly scratch resistant and 99.8% opitcally pure. The camera features built-in reverse polarity and surge protection.
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In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Edge Grinding Machines
The requirement for the wafer quality is getting higher and the condition of wafer edge is getting more important. The edge grinders “W-GM series” process edge grinding of various kind of materials such as Silicon, sapphire and SiC.As a solution for that, Our W-GM series are highly rated among manufactures of silicon, compound materials and other wafer shaped materials. Wafer edge grinding machine also draws the attention as a solution for the yield loss due to the knife edge of device wafer in the back end process. In the semiconductor manufacturing process, from the wafer manufacturing to the device manufacturing, the quality improvement of wafer edge is necessary in recent years.We make proposals that achieve the improvement of quality, CoO and yield with our machine.
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Pressure Sensors
ESI Technology manufacture a wide range of pressure sensors using a variety of different technologies. Pressure transducers (voltage output), pressure transmitters (milliamp output), panel meters, accessories. Silicon-on-Sapphire technology and a titanium diaphragm combine to make the new Gold Standard in pressure sensing. Custom pressure measurement solutions have been integral to ESI’s success. All aspects of design and manufacture are done in-house at our UK facility. Impressive quality at an affordable price. So if you don’t see what you are looking for, just ask.
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Ceramics and Glass Inspection Systems
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
