Showing results: 286 - 300 of 685 items found.
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PB3600 -
Integrated Technology Corp.
The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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ECOPIA
As one of the most important module in Probe_Station, manipulator is an accurate system that probe micro distance() and contact on the electrode of semiconductor wafer, device. ECOPIA's Manipulator is very easy to use and probe arm's elastic plate is good to protect sample's surface, from being damaged by Z direction movement.
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VIEW Micro-Metrology
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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U2941A -
Keysight Technologies
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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CWTMini50HF -
Power Electronic Measurments Ltd
For high-speed and high power-density power electronic applications. This higher bandwidth probe is ideal for measuring the faster current transients in today’s new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes.
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Onto Innovation
In the race to digitize semiconductor manufacturing operations, Onto Innovation’s productivity software delivers the competitive advantage you need to capture market share. Our software connects information on a tool, within a factory, or across an entire global supply chain to capitalize on the potential of your biggest asset: your data.
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PM2000 -
Applied Test Resources
The PM2000 is a high voltage power source capable of supplying up to 2000 V and sourcing 10mA to a load. The high potential at 2 kV fulfills coverage for mostly all semiconductor devices where leakage and breakdown measurements are involved. The module has been incorporated with interlock feature to ensure safety.
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Model 520 -
TREK, INC.
The Trek Model 520 Hand-Held Electrostatic Voltmeter (ESVM) Series products provide accurate, noncontacting measurements of electrostatic surface voltage for ESD applications in either ionized or non-ionized environments. Industrial applications include measuring charge accumulation in the LCD manufacturing process or measuring static charge in semiconductor production.
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Recif Technologies Inc.
RECIF Technologies history started in 1982 offering its first wafer handling solution: Vacuum handling Systems.Based on this historical technical mastery, Recif Technologies provides today a full range of single wafer manual vacuum handling solutions adapted to our customers’ and current Semiconductor industry’s’ requirements.
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Shenzhen Noyafa Electronic CO.,LTD
Noyafa GAS Tester uses high-quality semiconductor sensors, which can effectively eliminate interference and accurately obtain the concentration of formaldehyde, TVOC, etc. within the measurement range, accurate to the thousandth. With more than ten years of professional testing background, well-known big brands are more at ease and assured to use.
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General Tools & Instruments
refrigerant leak detectors use a proprietary semiconductor sensor to detect most commercially available HFC, HFO, HC, HCFC and CFC refrigerants. Our newest model, the RLD440 Refrigerant Leak Detector, goes one step further by complying with all five worldwide refrigerant detection testing standards
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Tropel® FlatMaster® MSP -
Corning Inc.
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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SEMIFLOW CO.65 -
SONOTEC GmbH
SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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MXI Quadra 5 -
Nordson Corporation
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Material Interface, Inc.
Stainless steel is defined as a steel alloy with a minimum of 10.5 weight percent chromium. Although stainless steel does not generally corrode as easily as ordinary steel, different grades are necessary for different environments. For example, several manufacturing groups (including semiconductor and pharmaceutical) have stringent requirements for stainless steel surfaces.