Showing results: 421 - 435 of 685 items found.
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MicroINSPECT 300FA -
Microtronic, Inc.
The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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PDF Solutions
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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AXI XS Series -
Nordson Corporation
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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Hitachi, Ltd.
We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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AB Controls, Inc.
Our multidisciplinary approach allows us to create functional testers and automated test equipment for a variety of industries. AB Controls provides customized automated test equipment solutions for a wide range of products and instruments including: electronics, laser, electromechanical, optical, semiconductor and chemical.
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7000 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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7500 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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ORTEC
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe radiation detector solutions covering an extensive range of energies and for a variety of applications.
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SLIA-300 -
HORIBA, Ltd.
The ultra-pure water that is used in the semiconductor production processes can be further purified by using an ion-exchange resin. Capturing the silica that is dissolved from this ion-exchange resin as quickly as possible can control the ultra-pure water quality, which is important during the production processes.HORIBA Advanced Techno has developed and employed a new "long light path length measurement cell" to enable highly sensitive measurement of ultra-low density silica and also realized a compact desktop model to improve the usability.
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CM-200A/210A -
HORIBA, Ltd.
The CM-200A/210A hydrofluoric acid monitors have been developed specifically to meet the stringent demands of semiconductor manufacturing. The CM-200A/210A provides a real time read-out of hydrofluoric acid concentration by measuring the electric conductivity of the sample solution. These superior units offer high repeatability even at low concentrations. The CM-200A/210A can be used for a variety of purposes ranging from monitoring etched wafer cleaning processes to any other industrial application of hydrofluoric acid.
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HT-110 -
HORIBA, Ltd.
The continuous online TOC-Analyzer HT-110 is suitable for the measurement ot total organic carbons in Purified Water (PW), Water For Injection (WFI) and Highly Purified Water (HPW). The unit is operating according to USP 643. It is applicable for pharmaceutical and/or semiconductor manufacturing. The measuring principle is based on UV-Oxidation and measurement of the difference in conductivity. TOC concentration measurement (TOC concentration 500 ppbC or lower) is necessary to perform quality control according to GMP (Good Manufacturing Practice).
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E-CAM130_CUTX1 -
e-con Systems Inc.
e-CAM130_CUTX1 - 13MP Jetson TX2/TX1 camera board is a 4-lane MIPI CSI-2 camera solution for NVIDIA® Jetson TX2/TX1 developer kit. The e-CAM130_CUTX1 Board uses 13MP custom Lens camera module based on AR1820 CMOS Image sensor from ON Semiconductor. This camera daughter board can be directly interfaced to the NVIDIA® Jetson TX2/TX1 developer kit. The e-CAM130_CUTX1 is a 13MP color camera with the S-mount (also known as M12 board lens) lens holder.
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E-CAM50_CU96 -
e-con Systems Inc.
e-CAM50_CU96 is a 5MP Fixed focus MIPI camera for 96Boards compliant Rock960 developer kit featuring Rockchip RK3399 processor. This 4-lane MIPI Camera for Rock960 board is based on our popular low-light camera module, e-CAM55_CUMI0521_MOD which has 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® and a built-in Image Signal Processor (ISP). It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement.
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2325 -
ALS Co., Ltd
Model 2325 is a very low-price and high-performance Bi-Potentiostat based on modern semiconductor circuity and advanced software technology. Low noise, high speed and small space measurement were considerate for the development of Model 2325. The user-friendly interface is designed for supporting wide applications. Model 2325 can be applied in various experiments, such as RRDE, sensor development and spectroelectro-chemical measurements, etc. It can be not only applied for research purpose, but also for student experiments and industrial applications due to the low-price and high-performance.
