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Semiconductor

active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.

See Also: iJTAG


Showing results: 526 - 540 of 685 items found.

  • Curve Tracer

    Series 5000C - Scientific Test, Inc.

    Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.

  • RF Power Generators

    MKS Instruments

    MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.

  • Nano-focus X-ray Inspection System

    X-eye NF120 - SEC Co., Ltd.

    Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.

  • Metrology System

    IMPULSE V - Onto Innovation

    With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.

  • Discrete Component Tester

    XP-8500 - Lorlin Test Systems

    Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.

  • In-Circuit Fixtures

    Petracarbon Pte Ltd

    IndustriesProducts and ServicesPetracarbon is an international provider of focused and robust Automatic Test Equipment or ATE solutions designed to enable mobile, semiconductor, power, RF and circuit board companies to implement top quality test strategies to lower their cost of test.Petracarbon Fixture Group provides support for PCBA Manufacturing Test Requirements. We provide sales, programming, engineering, manufacturing and service centers in Asia.

  • Multifunction Instrument for Education and Training

    LabXplorer - DesignSoft, Inc.

    LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.

  • PXI Waveform Generator

    NI

    PXI Waveform Generators can produce precise waveforms including sine, square, triangle, and ramp as well as arbitrary, user-defined waveforms using sequences of data or streaming continuously from a host or peer-to-peer instrument within the PXI system. These instruments are ideal for tightly synchronized, mixed-signal test systems in scientific research or test of semiconductor devices, consumer electronics, automotive, and aerospace/defense.

  • Microscope Photoluminescence Spectrometer

    Flex One - ZOLIX

    Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.

  • Wide Temperature Range HDR USB3.1 Gen1 Camera Board (Color)

    See3CAM_CU20 - e-con Systems Inc.

    See3CAM_CU20 is a 2.0 MP HDR USB camera board with ultra-Lowlight performance. It has an ability to stream seamlessly at wide temperature range (-40°C to 85°C). This Full HD USB3.1 Gen1(5Gb/Sec.) camera is based on 1/2.7" AR0230AT CMOS digital image sensor with a pixel size of 3.0 μm x 3.0 μm from ON Semiconductor™. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement. It is a Plug-and-Play camera (UVC compliant) for Windows, Linux. This HDR camera is also backward compatible with USB 2.0 host ports.

  • 3.4 MP Autofocus Liquid Lens NVIDIA® Jetson TX2/TX1 Camera Board

    E-CAM31_TX2 - e-con Systems Inc.

    e-CAM31_TX2 is a 3.4 Mega pixel 4-lane MIPI CSI-2 liquid lens Auto focus camera board for NVIDIA® Jetson TX2 developer kit and it is also compatible with NVIDIA® Jetson TX1 developer kit. This camera is based on 1/3 inch AR0330 CMOS Image sensor from ON Semiconductor® with 2.2 µm pixel and A-Pix™ technology and an integrated high performance image signal processor (ISP). This S-Mount (M12) liquid lens camera enables autofocus with no mechanical moving part like VCM (Voice Coil Motors) will increase the lifetime and has an ability to focus and refocus in a matter of milliseconds.

  • Desolvating Nebulizer

    Aridus3 - Teledyne LABS

    The CETAC Aridus3​ Desolvating Nebulizer System is a specialized liquid sample introductio​n accessory for inductively coupled plasma mass spectrometry (ICP‑MS). The Aridus3 can enhance analyte sensitivity up to 10 times or more ​​​and can greatly reduce solvent-based interferences such as oxides and hydrides.The Aridus3 couples a low-flow (50, 100, or 200 µL/min) PFA nebulizer and a heated PFA spray chamber with an inert fluoropolymer membrane. This combination provides enhanced analyte sensitivity while reducing solvent based interferences such as oxides and hydrides. The Aridus3 is particularly advantageous for small volume and highly corrosive samples such as those generated in the earth sciences and the semiconductor industry.

  • Laser Turbidity Meter

    HU-200TB-EH - HORIBA, Ltd.

    HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.

  • Development Board

    Blip - Electronut Labs

    Blip is a development board for Bluetooth Low Energy (BLE) and 802.15.4 based wireless applications, based on the Nordic Semiconductor nRF52840 SoC. It has a Black Magic Probe compatible programmer and debugger built-in along with temperature/humidity sensor, ambient light intensity sensor, and a 3-axis accelerometer. It is usable to prototype for very low power applications, and debugger and regulator can be disconnected when only SoC needs to be powered.

  • Applications

    VIEW Micro-Metrology

    No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.

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