Showing results: 631 - 645 of 685 items found.
-
Renesas Electronics Corp.
Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
-
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
-
Keysight Technologies
Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
-
DRK6691 -
Shandong Drick Instruments Co., Ltd.
Drk6691 small low constant temperature trough is a special product designed for small Abbe refractometer, supporting the use of. It has many advantages such as constant speed, constant temperature, small volume, low noise and convenient operation and so on , so it is a higher price products. This product adopts the technology of the one chip computer, PID selftuning regulation technology;adopts imported platinum resistance temperature (Pt100), so it has high precision of temperature control and temperature fluctuation is small; adopts the semiconductor refrigeration technology, so that it consists of advantages of fast refrigeration, no noise.
-
Hitachi, Ltd.
Hitachi Power Semiconductor Device offers intelligent power devices and high voltage analog switch ICs integrating high voltage output devices and control circuits on a single chip/single package using dielectric isolation technology. *High voltage ICs are suitable for household apparatus fields such as home electric appliances and beauty appliances.* These ICs can be easily used for various purposes, and market-leading companies in air conditioner fan motors have adopted them.※We have continued to improve performance and quality of the ICs since sales start in 1994 and have more than 20 years of sales results.
-
Imaginant Inc.
Utilizing optical and semiconductor fabrication techniques, Imaginant manufactures the PureView PrecisionTM line of RoHS-compliant delay-line ultrasound transducers with center frequencies ranging from 50 MHz to 250 MHz (higher and lower transducer frequencies are also available). Imaginant's precision-manufacturing process produces transducers that exhibit high reliability and high uniformity from device to device. This manufacturing consistency enables uniform test system performance to be attained across multiple systems. Imaginant transducers are available in focused and flat-face models that can be produced with minimal-damping for applications requiring maximal sensitivity or with maximal-damping and high-bandwidth for applications requiring the highest-degree of temporal precision.
-
TurboDisk Family -
Veeco Instruments Inc
A rapidly developing technology with multiple proof-of-concept scale installations (1 MW or less), with many more larger-scale projects gaining momentum worldwide within regions with high direct normal irradiance (DNI). As/P MOCVD is proving to be the technology of choice in building the critical compound semiconductor layers for CPV devices. Veeco, supplying best-in-class MOCVD equipment, provides the critical enabling As/P MOCVD technology to reduce the production costs of triple junction solar cells and provides manufacturers with the ability to easily ramp production in a modular system with unmatched reliability and throughput at the lowest cost.
-
ACMAS Technologies Pvt. Ltd.
Constant Temperature and Humidity Test Chamber from Weiber are environmental test chambers, designed to simulate constant climatic conditions for testing a wide variety of products for their quality, performance, shelf life and stability. They are used to simulate constant temperature and humidity conditions, thereby creating a physiologically ideal environment for product testing. These equipments are most commonly employed for testing electrical devices, electronic parts and components, instruments, biological samples, food items and other manufactured and processed goods and find widespread usage in scientific research organizations, semiconductor industries, material research institutes and other industrial and manufacturing units.
-
CryoTel® DS30 -
Sunpower Inc.
The CryoTel® DS 30 Stirling cryocooler offers efficient, reliable, compact and high power cooling to the market in the temperature range of 35 to 250 Kelvin. The DS30 was optimized for applications in which SWAP (size, weight and power) and reliability are concerns. The DS30 consumes considerably less power than other cooling alternatives and requires no maintenance, making it ideal for strategic as well as industrial applications. Both the cold head and the pressure wave generator can be mounted in any orientation. Application examples include semiconductor manufacturing, large infrared detectors, RF receivers or antennas, astronomical telescopes, laser cooling, high-temperature superconductivity, cold traps, and others.
-
Instec, Inc.
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
-
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
-
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
-
SystematIC
In our world of smart appliances sensing the physical aspects of our environment is key: we like to know (measure) temperature, sunlight, position, distance, pressure and so on, and use that information in our (control) systems. For that data to be processed the (analog) physical signals need to be converted to electrical signals: the function of the sensor. An integrated (smart) sensor can do this and when realized in semiconductor technology can be mass-produced at low-cost. With our analog IC design expertise we have been involved in the development of many sensor readout circuits. But we also take care of integration of the related signal processing such as high resolution AD conversion and the digital interfacing.
-
Hexagon Family -
CAEN S.p.A.
Hexagon is a high precision 32k MCA available in single and dual input channel versions. This compact, high performance desktop MCA includes features such as an input stage for signal conditioning, a fast analog-to-digital converter (ADC), digital signal processing algorithms, High Voltage and Preamplifier outputs for detector bias and preamp power. Hexagon is ideally suited for applications using high energy resolution semiconductor detectors such as HPGe, Silicon, CZT as well as scintillation detectors such as NaI and LaBr3. It can manage both positive and negative signals from resistive feedback or transistor reset preamplifier detectors as well as signals coming from PMT anodes.
-
AOI -
ficonTEC Service GmbH
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
