Showing results: 121 - 135 of 685 items found.
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Nano-View Co. Ltd.
~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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HS-WDI -
HenergySolar
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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LEMSYS
Highly reliable power semiconductor testing and traceability at mass production speed
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XT V 130C -
Nikon Metrology, Inc.
The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system.
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Aven Inc.
Semiconductor device that emits visible light when an electrical current passes through it.
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Petracarbon Pte Ltd
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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EagleView -
Microtronic, Inc.
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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yieldHUB -
MFG Vision
yieldHUB is fast, scalable and comprehensive. Leading fabless and IDM semiconductor companies choose yieldHUB.
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Evans Analytical Group®
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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OPTI-Sense Series -
Teledyne Advanced Pollution Instrumentation
The OPTI-Sense series of sensors is based on Non-Dispersive Infrared (NDIR) technology. They are designed to precisely measure the absorbance in the infrared spectrum of specialty gases typically found in semiconductor applications. They are very compact and designed with no moving parts, making the OPTI-Sense robust and ideal for continuous in-situ gas monitoring of semiconductor processes.
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SiliconAid Solutions, Inc.
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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UNIVANS Co., Ltd.
The semiconductor manufacturing process is divided into a front process (WAFER) and a post process (PACKAGE). The LOAD BOARD is an INTERFACE device for inspecting the function and performance of a package state IC, which is a post process, It is an INTERFACE key device for inspection. In particular, LOAD BOARD is widely used in non-memory semiconductor inspection equipment.