Showing results: 106 - 120 of 216 items found.
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N4370P01A -
Keysight Technologies
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
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ACS -
Tektronix, Inc.
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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PANTHER 2K QST -
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Test Head Engineering, LLC
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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Universal Scan
Provides a simple and inexpensive debug technique where you can monitor and control the pins on JTAG enabled devices from your PC in real time without having to setup test vectors, test executives, CAD data, etc. Includes; Debugging - Scripting - Chain testing - BSDL Validation - Package Builder - SPI Flash Programmer - Parallel Flash Programming
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Keysight Technologies
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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MTO -
Flynn Systems Corp.
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Tag-Connect -
Tag-Connect, llc
Tag-Connect is a simple and secure way of connecting debuggers, programmers and test equipment to your PCBs. Tag-Connect uses a specially designed and patented connector for making the connection to your PCB (Patent Pending for the -NL versions). Tag-Connect eliminates the need for a programming or JTAG connector on your PCB.
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AccelQ -
accelQ
*Automates test design and execution with a focus on business process*Enables manual testers and business analysts to automate without the need for programming*Ensures design-first approach with inbuilt modularity; No need for custom frameworks.*Enables early automation with industry first virtualized abstraction for functional testing
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L4400 Series -
Keysight Technologies
The Keysight L4400 Series of switches, digital input/output and analog output instruments offer the best tradeoff in size, functionality and test. They are standalone instruments that perform the same function as their companion 34980A-Series plug-in modules. They come with a fully operational programming interface including a web-page for easy control.
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TOPTEST GmbH
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Trifecta-GPU -
RADX Technologies, Inc
The Trifecta-GPU™ Family of COTS PXIe/CPCIe GPU Modules are the first COTS products that bring the extreme compute acceleration and ease-of-programming of NVIDIA® RTX® A2000 Embedded GPUs to PXIe/CPCIe platforms for modular Test & Measurement (T&M) and Electronic Warfare (EW) applications.
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BatteryPro -
Chroma Systems Solutions, Inc.
The software is item driven with built-in tests – meaning no programming is required at all. Users are able to read data from the BMS controller and also includes thermal chamber control. Battery Pro Software supports Chroma’s regenerative battery cyclers and provides a safe and stable testing environment.
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Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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SPEA S.p.A.
- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
