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Interferometers

Combine waves to reveal their properties by measuring the pattern of interference.

See Also: Beam Splitters


Showing results: 106 - 120 of 140 items found.

  • Multi-Surface Profiler

    Tropel® FlatMaster® MSP - Corning Inc.

    The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.

  • 1/4-Inch Cube Corner

    10713D - Keysight Technologies

    The Keysight 10713D is one component of a family of measurement optics that tailor interferometer systems for the physical layout and measurement requirements of individual applications. Configured with appropriate laser head and system electronics, the optics are part of a precise positioning system that improves product quality, increases yields, and facilitates manufacture of precision products.

  • Beam Directing and Reflecting Optics

    Keysight Technologies

    Beam directing and reflecting optics simply reflect, bend or translate the beam, but do not typically modify the polarization, except for polarizing beam splitters. For example, mirrors, cube corners and retroreflectors are attached to objects that move in order to keep the weight down on the moving object (instead of mounting the interferometer on the moving object).

  • Short Range Straightness Optics

    10774A - Keysight Technologies

    The Keysight 10774A Short Range Straighness Optics combines a straightness interferometer and reflector to make measurements over a range of travel up to 3 m (10 ft). The optics form a highly-accurate optical straightedge that can measure the straightness of travel of machine-tool and measuring-machine coordinate motions with a resolution of 0.04 micrometer (1 uin).

  • Angular Reflector

    10771A - Keysight Technologies

    The Keysight 10771A Angular Reflector, used in the Keysight 5530Laser Calibration System, is ideal for precision calibration applications. Paired with the 10770A Angular Interferometer, it is used to measure pitch and yaw motions along each axis that a machine tool or measuring machine travels. The system can help quickly locate and evaluate unwanted angular motion.

  • Leak Test System

    NorCom 2020 - NorCom Systems Inc.

    The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.

  • Precision Optics and Assemblies

    Keysight Technologies

    For more than 35 years, Keysight has been designing and fabricating leading-edge optics for use in our laser interferometer systems. You can take advantage of this engineering, component fabrication, and assembly expertise and our state-of-the-art optics manufacturing facility in Santa Clara, California to deliver cutting-edge optical solutions to your customers:

  • Gravity Measurement

    Teledyne e2v

    Quantum gravity measurement is emerging as a new frontier in sensing, bringing the ability to passively detect objects and voids, through difficult to penetrate materials such as soil, rock, lead and water. Gravity measurement using cold atom interferometers is set to revolutionise nearly all industries from civil to oil and gas, mining to maritime, and medical to defence.​

  • Retroreflector

    10767A - Keysight Technologies

    The Keysight 10767A Linear Retroreflector is one component in a family of measurement optics that tailor interferometer systems for the physical layout and measurement requirements of each application. When configured with appropriate Keysight5530 Laser Calibration System components, 10767A becomes part of a precise positioning system that improves product quality, increases yields, and facilitates the manufacture of precision products.

  • Retroreflector

    10704A - Keysight Technologies

    The Keysight 10704A retroreflector (cube corner) is a measurement reflector for single-beam measurements. It is paired with the Keysight 10705A single beam interferometer and is designed for making limited space, single-axis measurements. If mass is critical, the Keysight 10704A is available without housing as the Keysight 10713C, and for extremely critical mass requirements, the Keysight 10713D 1/4-inch base retroreflector can be used.

  • HES Spectrometers

    Is-Instruments

    ISI’s standard HES spectrometer offers a 100-fold increase in throughput over conventional systems currently available. This increased throughput can lead to a superior signal-to-noise ratio (SNR) for a given observation over a Czerny Turner instrument. The HES spectrometer contains no moving parts and yet offers the advantages of a Michelson Interferometer with the spectral properties of a traditional diffraction grating-based device, such as a Czerny Turner spectrometer.

  • Optical Wavelength Meters

    ADC Corporation

    Optical wavelength meter that uses a He-Ne laser as reference wavelength and employs the Michelson interferometer method, providing high-accuracy measurement. It can measure emission center frequencies of LDs for DWDM with high resolution and accuracy.The 8471 even provides a high sampling rate of 10 times per second, and is suitable for oscillation wavelength adjustment. In addition, its deviation display function allows wavelength variation to be measured with high resolution and accuracy.

  • Receiver

    10780C - Keysight Technologies

    The Keysight 10780C is a highly-sensitive, lowest-cost Keysight receiver used with laser interferometer positioning systems. One receiver is used per measurement axis (including wavelength tracker). Configured with Keysight electronics, laser heads, cables and optics, the Keysight 10780C receiver allows you tailor a precise positioning system for your exact application requirements.

  • Create Topographic Profiles from SPM Images

    TopoStitch - Image Metrology A/S

    topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.

  • Ultra-High Resolution Spectrometers

    Is-Instruments

    Fabry-Pérot interferometers are optical resonators used for high-resolution spectroscopy. They use the phenomenon of multiple-beam interference that results when light shines through a cavity bounded by two reflective parallel surfaces. When the light hits one of the surfaces, some is transmitted out, and the remaining part is reflected back. Fabry-Pérot produces a circular fringe pattern, similar to the Michelson pattern. However, the fringes are thinning, brighter, and more widely spaced. As a result, these instruments are able to detect and resolve the fine features of a transmission spectrum with high precision.

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