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Lasers

Light Amplification by Stimulated Emission of Radiation.

See Also: Laser Sources, Femtosecond


Showing results: 1366 - 1380 of 1427 items found.

  • 3D Micro Coordinate Measurement Machine and Surface Roughness Measurement Device

    InfiniteFocusSL - Alicona Imaging GmbH

    With the InfiniteFocusSL you are able to measure form and roughness of your components with only one system. In addition, color images with high contrast and depth of focus are achieved. The robust frame and the intelligent illumination technology provide fast and high-resolution measurement in the laboratory and a production near environment. The measurement system is particularly attractive due to its cost effectiveness, measurement speed and usability. The long working distance in combination with the above average measurement field allows a wide range of applications. Measurements are achieved within seconds, and features, such as a coaxial laser for quick and easy focusing, enhance its usability.

  • Universal Pylon Tester

    MS 1121 - Meltronics Systemtech

    Portable test equipment to check the electrical functionalities of pylons by simulating various store types in aircraft. This system is able to simulate the functionalities of different PIBs (IB/MB/CF, OB & Laser). The system provides facility to test two Pylons in parallel. The tester provides aircraft specific AC &DC voltages and facility to inject discrete inputs for checking output(s) viz firing voltages, fusing voltages. The system provides four channels of RS422 and Two channels of 1553B communication. Portable unit with caster wheels with all required hardware, power supplies, instruments, connectors and laptop housed in it.

  • AFM (Atomic Force Microscope) Optical Platform

    HORIBA, Ltd.

    The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.

  • Cryocooler

    CryoTel® DS30 - Sunpower Inc.

    The CryoTel® DS 30 Stirling cryocooler offers efficient, reliable, compact and high power cooling to the market in the temperature range of 35 to 250 Kelvin. The DS30 was optimized for applications in which SWAP (size, weight and power) and reliability are concerns. The DS30 consumes considerably less power than other cooling alternatives and requires no maintenance, making it ideal for strategic as well as industrial applications. Both the cold head and the pressure wave generator can be mounted in any orientation. Application examples include semiconductor manufacturing, large infrared detectors, RF receivers or antennas, astronomical telescopes, laser cooling, high-temperature superconductivity, cold traps, and others.

  • 14-bit 16 Concurrent Channel 65MSPS A/D board

    AD14-65Mx16AVE - Ultraview Corporation

    14-bit 16-concurrent channel 65MSPS A/D board for demanding large-system uses, where signals on multiple time-aligned channels need to be observed with high SNR, such as RADAR, nuclear instrumentation, ultrasound, medical imaging, spectroscopy, communications systems, RF component and antenna testing and other critical applications. An on-board low-jitter LMX2581-based RF synthesizer allows any A/D sampling rate between 20MSPS and 65MSPS to be specified in software. A second on-board LMX2581 with synchronized reference can be optionally used to output four stimulus clocks on SMA connectors that can be vectored to any combination of 4 external transmitters, microwave pulse generators, laser modulators, and other devices.

  • EDFA

    SPA-08-XX - Hangzhou Softel Optic Co., Ltd.

    1550nm series multi-outputs optical amplifier gain spectrum bandwidth between 1545~1563nm, adopt high reliability multimode pump laser and double clad fiber, the unique APC, ACC and ATC circuit, the max output power can reach to 40dBm, one device and replace the original several to dozens traditional EDFA, can greatly save the cost and maintenance expense, improve the stability of the network operation, high output power 1550nm optical amplifier is playing an increasingly important role in the continuous extension of the optical fiber network, providing a flexible and low-cost solution for the wide coverage of CATV system in large and medium-sized cities.

  • EDFA

    SPA-32-XX - Hangzhou Softel Optic Co., Ltd.

    1550nm series multi-outputs optical amplifier gain spectrum bandwidth between 1545`1563nm, adopt high reliability multimode pump laser and double clad fiber, the unique APC, ACC and ATC circuit, the max output power can reach to 40dBm, one device and replace the original several to dozens traditional EFDA, can greatly save the cost and maintenance expense, improves the stability of the network operation, high output power 1550nm optical amplifier is playing an increasingly important role in the continuous extension of the optical fiber network, providing a flexible and low-cost solution for the wide coverage of CATV system in large and medium-size cities.

  • UV & Visible Frequency Mixing Module

    SolsTiS EMM - M Squared Lasers

    The SolsTiS External Mixing Module (SolsTiS EMM) provides fully automated tuning in the visible (480-670 nm) and IR (1.1-4.5 µm) with further extensions options into the UV (300-350 nm). It delivers high stability sum and difference frequency mixing of SolsTiS wavelengths with other single frequency sources, primarily via high efficiency single pass mixing in PPLN. This all-solid state solution for wavelength coverage supersedes dye lasers, removing the hazards and instabilities associated with this toxic gain material. SolsTiS EMM delivers unparalleled performance and reliability, enabling you to automatically tune and scan over a broad wavelength range.

  • *Divergent Light Measurement

    mks Ophir

    The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.

  • Three-Phase Smart Socket

    WECO 3230 - Radian Research, Inc.

    Utilize the RW-3X's features while on site in the van, as well as back at the shop with the WECO 3230 Three-Phase Smart Socket. The 3230 features built-in laser optics, Smart Socket™ technology and automatic meter form selection. Connect the RW-3X to the 3230 side panel using the included cables and the RW-3X Winboard Embedded software automatically sets the meter form, which will then populate on the WECO 3230 LCD display panel, and now you are ready to test. Not only does the 3230 make testing meters a snap, but it expands the current capability of the RW-3X to a full 50 amps, allowing the user to test class 320 amp meters.

  • FLIM Camera Systems

    Excelitas Technologies Corp.

    The Excelitas pco.flim camera system consists of the pco.flim camera and pco.flim laser, with a complete frequency synthesizer, which is required for the generation of the modulation signals in the frequency domain. The pco.flim series features a high frequency modulated CMOS image sensor that enables pixel-wise measurements of sample luminescence lifetime distributions in frequency domain suitable for fluorescence lifetime imaging. At a maximum speed of 10 Hz, full luminescence lifetime distributions can be measured at 1 Mpixel resolution. With flexible coupling and easy setup, the pco.flim is an ideal choice for wide-field FD-FLIM instruments and suitable for a variety of biomedical applications requiring a large frame and high-speed acquisition.

  • High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)

    PZ2121A - Keysight Technologies

    The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.

  • High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)

    PZ2120A - Keysight Technologies

    The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.

  • Near Field Scanning Optical Microscope

    MCL-NSOM - Mad City Labs Inc.

    The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our successful resonant probe SPM and incorporates common elements such as the MadPLL® phase lock loop controller. The NSOM also exploits our expertise in precision motion control by including six axes of motorized positioning, for the sample and NSOM probe, and three axes of closed loop nanopositioning to provide exceptional position resolution and accuracy. The MCL-NSOM also includes a 635nm laser excitation source, fiber launch, oil immersion objective lens (100x, 1.25 N.A.), CMOS alignment camera and avalanche photodiode detector. The microscope configurable design allows researchers to tailor the instrument for many different optical microscopy techniques including near field spectroscopy. The MCL-NSOM is operated in aperture mode with shear force feedback. The standard 5 modes are supported: illumination, collection, illumination and collection, reflection and reflection collection. We supply a LabVIEW™ based software package which automates the motion control features.

  • Precision Flying Probe Platforms For Automated Test Applications

    Huntron

    Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.

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