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ATE

ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.

See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems


Showing results: 1 - 15 of 1020 items found.

  • ATE

    multiLane

    Below is a list of high speed scopes and BERTs that form an integrated extension to Advantest’s V93000 ATE tester. In addition to these instruments, Multilane offers turnkey solutions for ATE testing.

  • ATE

    QT 200 NXG - Qmax Test Technologies Pvt. Ltd.

    QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.

  • ATE Support

    Partech Systems Pty. Ltd.

    Partech´s talented ATE (Automatic Test Equipment) Support team can provide reliable in country support of ATE, ATE related hardware and fixtures and software.

  • Solar ATE

    MS 1534 - Meltronics Systemtech

    The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.

  • Functional ATE

    FineTest Inc.

    Functional ATE

  • Handlers for ATE

    Microtest S.p.A.

    Handlers for ATE by Microtest

  • ATE Support

    Terotest Systems Ltd.

    For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.

  • ATE Development

    Aero Engineering Support Group

    ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:

  • ATE Products

    Microtest S.p.A.

    Microtest ATE portfolio presents special patented solutions to reduce the cost of test.Our innovative ATE offers high multi-site efficiency, zero footprint and lower power consumption.We’re able to drastically reduce the engineering phase time also for special solutions tailored on customers’ needs.

  • RF ATE

    Viavi Solutions Inc.

    IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).

  • ATE Integration

    JTAG Technologies Inc.

    Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).

  • ATE Socket

    Meltak Technology

    Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin

  • Satellite ATE

    MS 1123 - Meltronics Systemtech

    Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.

  • ATE Computer

    MS 1201 - Meltronics Systemtech

    This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.

  • Mini ATE

    MINI 80 - SEICA SpA

    MINI 80 represents the maximum miniaturization available to date with an ATE tester.All potentials of an automatic test equipment is available within 19″/2U rack as a support for those seeking parametric tests with few test points, or for those requiring a standard test-bench platform.

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